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Automatic optical inspection system & method

  • US 20070154081A1
  • Filed: 02/27/2007
  • Published: 07/05/2007
  • Est. Priority Date: 12/24/2002
  • Status: Active Grant
First Claim
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1. A system comprising:

  • a chassis, comprising;

    a first station comprising an automatic optical inspection (AOI) device which performs AOI of an electrical circuit to identify candidate defects on the electrical circuit, and a second station comprising a verification device which performs verification of candidate defects identified by the AOI device;

    a first transportable support table which supports and transports a first electrical circuit between the first station and the second station;

    a second transportable table which supports and transports a second electrical circuit between the first station and the second station; and

    a controller which controls the first transportable table and the second transportable table;

    wherein AOI is performed on the first and second electrical circuits and verification is performed on the first and second electrical circuits without changing a relative height of the AOI device with respect to the chassis and without changing a relative height of the verification device with respect to the chassis.

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