Automatic optical inspection system & method
First Claim
Patent Images
1. A system comprising:
- a chassis, comprising;
a first station comprising an automatic optical inspection (AOI) device which performs AOI of an electrical circuit to identify candidate defects on the electrical circuit, and a second station comprising a verification device which performs verification of candidate defects identified by the AOI device;
a first transportable support table which supports and transports a first electrical circuit between the first station and the second station;
a second transportable table which supports and transports a second electrical circuit between the first station and the second station; and
a controller which controls the first transportable table and the second transportable table;
wherein AOI is performed on the first and second electrical circuits and verification is performed on the first and second electrical circuits without changing a relative height of the AOI device with respect to the chassis and without changing a relative height of the verification device with respect to the chassis.
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Abstract
A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.
14 Citations
17 Claims
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1. A system comprising:
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a chassis, comprising;
a first station comprising an automatic optical inspection (AOI) device which performs AOI of an electrical circuit to identify candidate defects on the electrical circuit, and a second station comprising a verification device which performs verification of candidate defects identified by the AOI device;
a first transportable support table which supports and transports a first electrical circuit between the first station and the second station;
a second transportable table which supports and transports a second electrical circuit between the first station and the second station; and
a controller which controls the first transportable table and the second transportable table;
wherein AOI is performed on the first and second electrical circuits and verification is performed on the first and second electrical circuits without changing a relative height of the AOI device with respect to the chassis and without changing a relative height of the verification device with respect to the chassis. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system comprising:
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a chassis, comprising;
an automatic optical inspection (AOI) means for performing AOI of an electrical circuit to identify candidate defects on the electrical circuit, and a verification means for performing verification of the candidate defects identified by the AOI means;
a first transport means for supporting and transporting an electrical circuit between the AOI means and the verification means;
a second transport means for supporting and transporting an electrical circuit between the AOI means and the verification means; and
a controller means for controlling the first transport means and the second transport means;
wherein the AOI means comprises means for performing AOI without changing a relative height of the AOI means with respect to the chassis; and
wherein the verification means comprises means for performing verification without changing a relative height of the verification means with respect to the chassis. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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Specification