Single event upset error detection within an integrated circuit
First Claim
Patent Images
1. A method of detecting single event upset errors within an integrated circuit, said method comprising:
- sampling an input signal;
storing said input signal as sampled as a stored signal within a sequential storage element;
detecting as an error a transition of said stored signal stored by said sequential storage element occurring at a time outside a valid transition period.
2 Assignments
0 Petitions
Accused Products
Abstract
An integrated circuit 2 includes logic circuitry 10 and sequential storage elements 8. Both the logic circuit 10 and sequential storage elements 8 can be subject to particle strikes giving rise to single event upset errors. These single event upset errors can be detected by detecting a transition in the stored value stored by the sequential storage elements 8 occurring outside of a valid transition period associated with that sequential storage element 8.
138 Citations
31 Claims
-
1. A method of detecting single event upset errors within an integrated circuit, said method comprising:
-
sampling an input signal;
storing said input signal as sampled as a stored signal within a sequential storage element;
detecting as an error a transition of said stored signal stored by said sequential storage element occurring at a time outside a valid transition period. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
-
-
17. An integrated circuit comprising:
-
a sequential storage element having an input receiving a input signal;
control circuitry coupled to said sequential storage element to control said sequential storage element to sample and store said input signal as a stored signal; and
a single event upset detector comprising a transition detector coupled to said sequential storage element and responsive to a transition of said stored signal stored by said sequential storage element occurring at a time outside a valid transition period to detect an error. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31)
-
Specification