REFLECTION TYPE OPTICAL SENSOR AND METHOD FOR DETECTING SURFACE ROUGHNESS

• US 20070164240A1
• Filed: 01/15/2007
• Published: 07/19/2007
• Est. Priority Date: 01/13/2006
• Status: Active Grant

• Current Assignee: Stanley Electric Company Limited
• Original Assignee: Stanley Electric Company Limited
• Inventors: OGAWA, Fumio, SHINNO, Kazuhisa
• Granted Patent: US 7,582,888 B2
• Time in Patent Office: Days
• US Class Current: 250/559.400
• CPC Class Codes: G01B 11/303 using photoelectric detection means

Abstract

A reflection type optical sensor can include a light emitting and receiving unit. The light emitting and receiving unit can include both a light emitting unit and a light receiving unit having light receiving sensitivity to light emitted from the light emitting unit. The light emitting unit and the light receiving unit can be arranged such that the optical axis of the light emitting unit intersects at a predetermined angle with the optical axis of the light receiving unit. The light emitting and receiving unit can be movably supported.

Claims

1. A reflection type optical sensor, comprising:

a housing,

a light emitting and receiving unit located adjacent the housing and including,

a light emitting unit having an optical axis in a light emission direction, and

a light receiving unit having an optical axis in a light reception direction and configured to sense light received from the light emitting unit, the light emitting unit and the light receiving unit being configured such that the optical axis of the light emitting unit in the light emission direction intersects at an intersection location and at a predetermined angle with the optical axis of the light receiving unit in the light reception direction, wherein

the light emitting and receiving unit is configured to be movable with respect to the housing.

2. The reflection type optical sensor according to claim 1, further comprising:

an arithmetic processing unit configured to perform arithmetic processing of a detected amount of first light and a detected amount of second light, the first light being emitted from the light emitting unit towards the intersection location such that when a surface of an object is positioned substantially at the intersection location and perpendicular to a bisector axis that passes through the intersection location and that bisects an intersecting angle between the optical axis of the light emitting unit and the optical axis of the light receiving unit the first light is reflected from the surface of the object and detected by the light receiving unit, the light emitting and receiving unit being located at a first location when the first light is emitted, the second light being emitted from the light emitting unit with the light emitting and receiving unit configured to be movable along the bisector axis and located at a second location that is different from the first location when the second light is reflected from the surface of the object and detected by the light receiving unit, whereby surface roughness of the object can be detected.

3. The reflection type optical sensor according to claim 1, wherein the light emitting unit includes at least one of a light emitting diode and a laser diode, and wherein the light receiving unit includes at least one of a photodiode and a phototransistor.

4. The reflection type optical sensor according to claim 2, wherein the light emitting unit includes at least one of a light emitting diode and a laser diode, and wherein the light receiving unit includes at least one of a photodiode and a phototransistor.

5. A reflection type optical sensor, comprising:

a light emitting and receiving unit including a light emitting unit having an optical axis in a light emission direction and a light receiving unit having an optical axis in a light reception direction and configured to sense light received from the light emitting unit, the light emitting unit and the light receiving unit being configured such that the optical axis of the light emitting unit in the light emission direction intersects at an intersection location and at a predetermined angle with respect to the optical axis of the light receiving unit in the light reception direction; and

a supporting member configured to be movable with respect to the light emitting and receiving unit to movably support an object to be measured such that a surface of the object is movable in a direction perpendicular to the surface.

6. The reflection type optical sensor according to claim 5, further comprising:

an arithmetic processing unit configured to perform arithmetic processing of a detected amount of first light and a detected amount of second light, the first light being emitted from the light emitting unit towards the intersection location such that when the surface of the object is positioned substantially at the intersection location and perpendicular to a bisector axis that passes through the intersection location and that bisects an intersecting angle between the optical axis of the light emitting unit and the optical axis of the light receiving unit the first light is reflected from the surface of the object and is detected by the light receiving unit, the supporting member being located at a first location when the first light is emitted, the second light being emitted from the light emitting unit with the supporting member configured to be movable along the bisector axis and located at a second location that is different from the first location when the second light is reflected from the surface of the object and is detected by the light receiving unit, whereby surface roughness of the object can be detected.

7. The reflection type optical sensor according to claim 5, wherein the light emitting unit includes at least one of a light emitting diode and a laser diode, and wherein the light receiving unit includes at least one of a photodiode and a phototransistor.

8. The reflection type optical sensor according to claim 6, wherein the light emitting unit includes at least one of a light emitting diode and a laser diode, and wherein the light receiving unit includes at least one of a photodiode and a phototransistor.

9. A reflection type optical sensor, comprising:

a light emitting unit having an optical axis; and

two light receiving units each having an optical axis and configured to sense light received from the light emitting unit, wherein

the light emitting unit and the two light receiving units are configured such that each of the optical axes of the light receiving units intersects the optical axis of the light emitting unit at a substantially identical predetermined angle, thereby detecting reflected light.

10. The reflection type optical sensor according to claim 9, further comprising:

an arithmetic processing unit configured to perform arithmetic processing of a detected amount of first light and a detected amount of second light, the first light being emitted from the light emitting unit such that when a surface of an object to be measured is positioned such that the surface is located substantially at a first intersection of the optical axis of the light emitting unit and the optical axis of one of the two light receiving units and is perpendicular to a bisector passing through the first intersection and bisecting an intersecting angle at the first intersection, and a second intersection of the optical axis of the light emitting unit and the optical axis of the other light receiving unit is positioned closer to the reflection type optical sensor than the first intersection is, the first light is reflected from the surface of the object at the first intersection and detected by the one of the two light receiving units, the second light being emitted from the light emitting unit and configured to be reflected from the surface of the object, to pass through the second intersection, and to be detected by the other light receiving unit, whereby surface roughness of the object can be detected.

11. The reflection type optical sensor according to claim 9, wherein the light emitting unit includes at least one of a light emitting diode and a laser diode, and wherein the light receiving unit includes at least one of a photodiode and a phototransistor.

12. The reflection type optical sensor according to claim 9, further comprising:

a light receiving guide located adjacent at least one of the light receiving units.

13. The reflection type optical sensor according to claim 9, further comprising:

a light receiving guide located adjacent each of the light receiving units, each of the light receiving guides having an optical light emitting axis, wherein the optical light emitting axes of the light receiving guides are spaced apart from each other along their length by a first distance, and the optical axes of the light receiving units are spaced apart from each other along their length by a second distance, wherein the first distance is less than the second distance such that the optical light emitting axes of the light receiving guides are closer together than are the optical axes of the light receiving units.

14. The reflection type optical sensor according to claim 9, further comprising:

a beam splitter located between the two light receiving units.

15. The reflection type optical sensor according to claim 9, wherein the two light receiving units are configured as a single monolithic unit.

16. The reflection type optical sensor according to claim 10, wherein the light emitting unit includes at least one of a light emitting diode and a laser diode, and wherein the light receiving unit includes at least one of a photodiode and a phototransistor.

17. A method for detecting surface roughness of a measuring surface, comprising:

providing a light emitting unit, a light receiving unit, an object to be measured, and a storage device including a first storage area and a second storage area;

irradiating the object to be measured with light from the light emitting unit and receiving reflected light from the object by the light receiving unit;

storing a first output from the light receiving unit in the first storage area;

changing a distance between the light emitting unit and the object;

irradiating the object with light from the light emitting unit after the distance is changed, and receiving reflected light from the object by the light receiving unit;

storing a second output from the light receiving unit in the second storage area;

performing computation using the first output and second output stored in the first and second storage areas, respectively; and

outputting results of the computation.

18. A method for detecting surface roughness, comprising:

providing a light emitting and receiving unit including a light emitting unit and a light receiving unit, an object to be measured, and a storage device including a first storage area and a second storage area;

placing the light emitting and receiving unit at a predetermined position relative to the object to be measured;

irradiating the object with light from the light emitting unit and receiving reflected light from the object by the light receiving unit;

outputting a first signal from the light receiving unit in accordance with an amount of the reflected light received;

storing a first output from the light receiving unit in the first storage area;

changing a distance between the light emitting and receiving unit and the object;

irradiating the object with light from the light emitting unit after the distance is changed and receiving second reflected light from the object by the light receiving unit;

outputting a second signal from the light receiving unit in accordance with an amount of the second reflected light received;

storing a second output from the light receiving unit in the second storage area;

performing predetermined computation using the first and second outputs stored in the first and second storage areas, respectively;

outputting results of the computation; and

outputting data for surface roughness based on the outputted results.

19. A method for identifying a material, comprising:

providing a light emitting and receiving unit including a light emitting unit and a light receiving unit, an object to be measured, and a storage device including a first storage area and a second storage area;

placing the light emitting and receiving unit at a predetermined position relative to the object to be measured;

irradiating the object with light from the light emitting unit and receiving reflected light from the object by the light receiving unit;

outputting a first signal from the light receiving unit in accordance with an amount of the reflected light received;

storing a first output from the light receiving unit in the first storage area;

changing a distance between the light emitting and receiving unit and the object;

irradiating the object with light from the light emitting unit after the distance is changed and receiving second reflected light from the object by the light receiving unit;

outputting a second signal from the light receiving unit in accordance with an amount of the second reflected light received;

storing a second output from the light receiving unit in a second storage area;

performing predetermined computation using the first and second outputs stored in the first and second storage areas, respectively;

outputting results of the computation; and

comparing the outputted results with predetermined standard data and estimating a type of the object, whereby material type identification of the object is performed.