DOWNHOLE SPECTRAL ANALYSIS TOOL

• US 20070171414A1
• Filed: 01/26/2006
• Published: 07/26/2007
• Est. Priority Date: 01/26/2006
• Status: Active Grant

• Current Assignee: Schlumberger Technology Corporation (SLB)
• Original Assignee: Schlumberger Technology Corporation (SLB)
• Inventors: Vannuffelen, Stephane, Indo, Kentaro, Terabayashi, Toru, Yamate, Tsutomu
• Granted Patent: US 7,511,813 B2
• Time in Patent Office: Days
• US Class Current: 356/328
• CPC Class Codes: G01J 3/18 using diffraction elements, e.g. grating gratings per se G02B

Abstract

Spectral analysis system for downhole applications is provided utilizing an inorganic replica-type grating that is configured to operate as a diffractive element that provides broad spectral coverage in high temperature downhole environments.

Claims

1. A downhole tool having a spectral analysis module comprising:

a replica grating comprising a substantially inorganic substrate having grooves therein with a grating groove density configured for wavelengths from about 200 nm to about 4000 nm.

2. The downhole tool according to claim 1, wherein

the groove density is from about 50 grooves/mm to about 5000 grooves/mm.

3. The downhole tool according to claim 1, wherein

the groove density is from about 100 grooves/mm to about 600 grooves/mm.

4. The downhole tool according to claim 1, wherein

the grating is configured for downhole fluorescence measurements of fluids in a borehole with wavelengths from about 400 nm to about 1000 nm.

5. The downhole tool according to claim 1, wherein

the grating is configured for downhole fluid analysis by absorption spectroscopy in a borehole with wavelengths from about 1400 nm to about 2100 nm.

6. The downhole tool according to claim 1, wherein

the grating is configured for downhole chemical sensing by dye injection of fluids in a borehole.

7. The downhole tool according to claim 1 further comprising:

a light source comprising one or more of a halogen bulb, a light emitting diode, a tunable laser and a monochromator.

8. The downhole tool according to claim 1, wherein

the grating is configured for high temperature applications in temperatures greater than or equal to 80 degrees Celsius.

9. The downhole tool according to claim 8, wherein

the grating further comprises a coating of metal and the grating is configured for reflecting incident light.

10. The downhole tool according to claim 8, wherein

the grating is configured for transmitting incident light.

11. The downhole tool according to claim 1, wherein

the grating substrate comprises substantially a material selected from the group consisting of glass, quartz, sapphire, silicon carbide and ceramic.

12. The downhole tool according to claim 1, wherein

the grating groove density is configured for spectral analysis in a spectral area comprising hydrocarbon overtone mode area.

13. A downhole fluid characterization apparatus comprising:

at least one optical spectrometer having a grating of substantially inorganic material, the grating being configured for at least five spectral wavelength channels having respective wavelengths greater than or equal to from about 200 nm.

14. The downhole fluid characterization apparatus according to claim 13, wherein

the grating comprises a replica-type grating having substantially one or more material selected from the group consisting of glass, quartz, sapphire, silicon carbide and ceramic.

15. The downhole fluid characterization apparatus according to claim 14, wherein

the grating has a coating of metal and is configured for reflecting incident light.

16. The downhole fluid characterization apparatus according to claim 15, wherein

the grating has a generally flat reflecting surface.

17. The downhole fluid characterization apparatus according to claim 15, wherein

the grating has a generally concave reflecting surface.

18. The downhole fluid characterization apparatus according to claim 14, wherein

the grating is configured for transmitting incident light.

19. The downhole fluid characterization apparatus according to claim 14, wherein

the grating is a tunable grating.

20. The downhole fluid characterization apparatus according to claim 13, wherein

the grating is configured for operation in a wavelength range including wavelengths in hydrocarbon overtone mode area.

21. The downhole fluid characterization apparatus according to claim 20, wherein

the wavelength range includes wavelengths from about 1600 nm to about 1800 nm.

22. The downhole fluid characterization apparatus according to claim 13, wherein

the grating is configured for 16 wavelength channels,

the apparatus further comprising:

a photo-detector array configured for detecting the 16 wavelength channels of the grating.

23. The downhole fluid characterization apparatus according to claim 13, wherein

the grating comprises grooves therein with a groove density of less than about 5000 grooves/mm.

24. The downhole fluid characterization apparatus according to claim 13, wherein

the grating comprises a replica-type grating configured for high temperature applications in temperatures greater than or equal to 80 degrees Celsius.

25. The downhole fluid characterization apparatus according to claim 13, wherein

the at least one optical spectrometer is configured for absorption spectroscopy of borehole fluids.

26. The downhole fluid characterization apparatus according to claim 13, wherein

the at least one optical spectrometer is configured for measurements of fluorescence reemission of borehole fluids.

27. The downhole fluid characterization apparatus according to claim 13, wherein

the at least one optical spectrometer is configured for Raman spectroscopy of borehole fluids.

28. A spectral analyzer for operation at high temperatures comprising:

a substantially inorganic grating for light spectral dispersion in downhole high temperatures;

a light source;

the spectral analyzer being configured for operation in high temperatures greater than or equal to 80 degrees Celsius and a wavelength range from about 200 nm to about 4000 nm; and

the grating having a groove density that is less than or equal to 2/wavelength_max, wherein wavelength_max represents the maximum operational wavelength of the grating.

29. The spectral analyzer for operation at high temperatures according to claim 28, wherein

the light source comprises a monochromator.

30. The spectral analyzer for operation at high temperatures according to claim 28, wherein

the light source comprises a tunable laser.