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Inline system for collecting stage-by-stage manufacturing metrics

  • US 20070173970A1
  • Filed: 01/20/2006
  • Published: 07/26/2007
  • Est. Priority Date: 01/20/2006
  • Status: Active Grant
First Claim
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1. A substrate comprising:

  • one or more circuits boards defined on the substrate;

    one or more automated optical inspection holes formed on the substrate; and

    a radio frequency identification (RFID) tag coupled to the substrate inside an automated optical inspection hole, the RFID tag configured to identify the one or more circuit boards as they pass through one or more manufacturing stages.

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