×

Measuring apparatuses and methods of using them

  • US 20070174013A1
  • Filed: 01/20/2006
  • Published: 07/26/2007
  • Est. Priority Date: 01/20/2006
  • Status: Active Grant
First Claim
Patent Images

1. A measuring instrument for measuring a value and providing a calibrated signal, comprising:

  • at least one primary sensor for sensing the value wherein the at least one primary sensor generates a primary measurement signal;

    at least one secondary sensor for generating at least one interference related signal for sensing at least one interference related value that reduces the precision of the primary measurement signal generated by the at least one primary sensor; and

    a microcontroller containing a criteria optimized correction polynomial having the at least one primary measurement signal and said at least one interference related signal as independent variables and said calibrated signal as a dependent variable;

    said microcontroller being connected to receive said at least one primary measurement signal and said at least one interference related signal, whereby said microcontroller corrects said at least one primary measurement signal for said at least one interference related signal to provide said calibrated signal.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×