Methods for finding and characterizing a deformed pattern in an image
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Abstract
A method is disclosed for finding a deformed pattern in an image using a plurality of sub-patterns. By advantageously restricting sub-pattern search ranges, search speed is improved, and the incidence of spurious matches is reduced. The method also quickly decides which sub-pattern result, of several potential candidates, is most likely to be the correct match for a deformed sub-pattern. Also, a method is provided for characterizing a deformed pattern in an image by using results from feature-based search tools to create a mapping that models the deformation of the pattern. A transform, selectable by a user, is fit to the results from the search tools to create a global deformation mapping. This transformation is fit only to feature points derived from matches resulting from successful sub-pattern search, without including data from areas of the pattern that were blank, not matched, or otherwise didn'"'"'t contain information about the pattern'"'"'s distorted location.
98 Citations
47 Claims
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1-22. -22. (canceled)
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23. A method for characterizing a deformed pattern in an image, the method comprising:
providing a plurality of features that represent the deformed pattern in the image;
dividing the plurality of features into a plurality of sub-pluralities, each sub-plurality representing a sub-pattern in the image, a plurality of the sub-patterns representing the deformed pattern;
determining a distance between each pair of sub-patterns of the plurality of sub-pluralities;
locating a first sub-pattern in the image so as to provide a first sub-pattern location;
locating a second sub-pattern in the image so as to provide a second sub-pattern location; and
using the first sub-pattern location and the second sub-pattern location for determining a deformation mapping that characterizes the deformed pattern in the image.
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24. A method for characterizing a deformed pattern in an image, the method comprising:
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dividing the deformed pattern into at least a first sub-pattern and a second sub-pattern;
locating the first sub-pattern in the image so as to provide a first sub-pattern pose;
locating the second sub-pattern in the image so as to provide a second sub-pattern pose; and
using the first sub-pattern pose and the second sub-pattern pose for determining a deformation mapping that characterizes the deformed pattern in the image. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47)
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Specification