METHODS AND APPARATUS FOR PREVENTING DEPOSITION OF REACTION PRODUCTS IN PROCESS ABATEMENT REACTORS
First Claim
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1. An apparatus for use during the abatement of a semiconductor manufacturing process comprising:
- a thermal reaction unit having;
an exterior wall having a plurality of perforations adapted to pass of a fluid therethrough;
an interior porous wall that defines a central chamber, the interior porous wall formed from a plurality of stacked porous sections;
at least one waste gas inlet in fluid communication with the central chamber and adapted to introduce a gaseous waste stream to the central chamber;
a thermal mechanism positioned within the central chamber and adapted to decompose the gaseous waste stream within the central chamber, thereby forming reaction products; and
a fluid delivery system adapted to provide a fluid through the perforations of the exterior wall and to the central chamber through the interior porous wall at a sufficient force to reduce deposition of reaction products on an inner surface of the interior porous wall of the central chamber;
wherein the perforations in the exterior wall provide a pressure drop across the thermal reaction unit of about 0.1 to about 5 psi.
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Abstract
In certain embodiments, methods, systems, and apparatus are provided for use in removing pollutants from a gas stream. The invention includes a thermal reaction unit formed from a plurality of stacked porous ceramic rings. The porous rings include perforations adapted to allow fluid to be flowed into the thermal reaction unit. By flowing fluid through the porous rings, deposition of waste effluent and/or by-products on the interior of the thermal reaction unit is prevented. Numerous other aspects are provided.
114 Citations
26 Claims
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1. An apparatus for use during the abatement of a semiconductor manufacturing process comprising:
a thermal reaction unit having;
an exterior wall having a plurality of perforations adapted to pass of a fluid therethrough;
an interior porous wall that defines a central chamber, the interior porous wall formed from a plurality of stacked porous sections;
at least one waste gas inlet in fluid communication with the central chamber and adapted to introduce a gaseous waste stream to the central chamber;
a thermal mechanism positioned within the central chamber and adapted to decompose the gaseous waste stream within the central chamber, thereby forming reaction products; and
a fluid delivery system adapted to provide a fluid through the perforations of the exterior wall and to the central chamber through the interior porous wall at a sufficient force to reduce deposition of reaction products on an inner surface of the interior porous wall of the central chamber;
wherein the perforations in the exterior wall provide a pressure drop across the thermal reaction unit of about 0.1 to about 5 psi.
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2. An apparatus for use during the abatement of a semiconductor manufacturing process comprising:
a thermal reaction unit having;
an exterior wall having a plurality of perforations adapted to pass of a fluid therethrough;
an interior porous wall that defines a central chamber, the interior porous wall formed from a plurality of stacked porous sections;
at least one waste gas inlet in fluid communication with the central chamber and adapted to introduce a gaseous waste stream to the central chamber;
a thermal mechanism positioned within the central chamber and adapted to decompose the gaseous waste stream within the central chamber, thereby forming reaction products; and
a fluid delivery system adapted to provide a fluid through the perforations of the exterior wall and to the central chamber through the interior porous wall at a sufficient force to reduce deposition of reaction products on an inner surface of the interior porous wall of the central chamber;
wherein the fluid deliver system is adapted to provide at least one of water, steam, air, clean dry air, clean enriched air, oxygen enriched air, oxygen depleted air, inert gas, a reagent, an oxidizer and depleted air;
wherein the fluid delivery system is adapted to provide a fluid at a pressure of about 600 psig or less. - View Dependent Claims (3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method for use during the abatement of a semiconductor manufacturing process comprising:
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providing a thermal reaction unit having;
an exterior wall having a plurality of perforations adapted to pass of a fluid therethrough;
an interior porous wall that defines a central chamber, the interior porous wall formed from a plurality of stacked porous sections;
at least one waste gas inlet in fluid communication with the central chamber and adapted to introduce a gaseous waste stream to the central chamber;
a thermal mechanism positioned within the central chamber and adapted to decompose the gaseous waste stream within the central chamber, thereby forming reaction products; and
a fluid delivery system adapted to provide a fluid through the perforations of the exterior wall and to the central chamber through the interior porous wall at a sufficient force to reduce deposition of reaction products on an inner surface of the interior porous wall of the central chamber;
wherein the perforations in the exterior wall provide a pressure drop across the thermal reaction unit of about 0.1 to about 5 psi; and
employing the thermal reaction unit to abate the semiconductor device manufacturing process.
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15. A method for use during the abatement of a semiconductor manufacturing process comprising:
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providing a thermal reaction unit having;
an exterior wall having a plurality of perforations adapted to pass a fluid therethrough;
an interior porous wall that defines a central chamber, the interior porous wall formed from a plurality of stacked porous sections;
at least one waste gas inlet in fluid communication with the central chamber and adapted to introduce a gaseous waste stream to the central chamber;
a thermal mechanism positioned within the central chamber and adapted to decompose the gaseous waste stream within the central chamber, thereby forming reaction products; and
a fluid delivery system adapted to provide a fluid through the perforations of the exterior wall and to the central chamber through the interior porous wall at a sufficient force to reduce deposition of reaction products on an inner surface of the interior porous wall of the central chamber;
wherein the fluid deliver system is adapted to provide at least one of water, steam, air, clean dry air, clean enriched air, oxygen enriched air, oxygen depleted air, inert gas, a reagent, an oxidizer and depleted air;
wherein the fluid delivery system is adapted to provide a fluid at a pressure of about 600 psig or less; and
employing the thermal reaction unit to abate the semiconductor device manufacturing process. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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Specification