INTEGRATED VACUUM METROLOGY FOR CLUSTER TOOL
First Claim
1. A substrate processing apparatus comprising:
- a load lock chamber having an inlet valve and an outlet valve configured to receive at least one substrate into a vacuum environment; and
an optical inspection device disposed in the vacuum environment, wherein the optical inspection device is adapted to emit a wavelength of less than 190 nanometers and is in communication with the vacuum environment.
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Abstract
Aspects of the invention generally provide an apparatus and method for processing substrates using a multi-chamber processing system that is adapted to process substrates and analyze the results of the processes performed on the substrate. In one aspect of the invention, one or more analysis steps and/or pre-processing steps are performed on the substrate to provide data for processes performed on subsequent substrates. In one aspect of the invention, a system controller and one or more analysis devices are utilized to monitor and control a process chamber recipe and/or a process sequence to reduce substrate scrap due to defects in the formed device and device performance variability issues. Embodiments of the present invention also generally provide methods and a system for repeatably and reliably forming semiconductor devices used in a variety of applications.
156 Citations
20 Claims
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1. A substrate processing apparatus comprising:
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a load lock chamber having an inlet valve and an outlet valve configured to receive at least one substrate into a vacuum environment; and
an optical inspection device disposed in the vacuum environment, wherein the optical inspection device is adapted to emit a wavelength of less than 190 nanometers and is in communication with the vacuum environment. - View Dependent Claims (2, 3, 4, 5, 8, 9)
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10. A substrate processing apparatus, comprising:
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a load lock chamber having an elevator assembly disposed in an evacuable environment; and
an optical inspection device disposed above the elevator assembly in communication with the evacuable environment. - View Dependent Claims (11, 12, 13, 14)
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15. A method of processing a substrate, comprising:
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transferring a substrate to an evacuable chamber through an inlet valve coupled to the evacuable chamber;
providing an environment in the evacuable chamber that is non-absorbing to wavelengths less than 200 nanometers;
inspecting the substrate with an optical device that shares the environment in the evacuable chamber with the substrate; and
transferring the substrate through an outlet valve after inspection. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification