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Test element analysis system with contact surfaces coated with hard material

  • US 20070202007A1
  • Filed: 08/21/2006
  • Published: 08/30/2007
  • Est. Priority Date: 03/10/2004
  • Status: Active Grant
First Claim
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1. A test element analytical system for the analytical examination of a sample comprising:

  • a test element having at least one measuring zone and electrically conductive contact areas, the sample to be examined being brought into the measuring zone for the analytical examination, and an evaluation instrument having a test element holder for positioning the test element containing the sample and a measuring device for measuring a change in the measuring zone that is characteristic for the analyte, the test element holder containing contact elements with contact areas which enable an electrical contact between the contact areas of the test element and the contact areas of the test element holder, wherein one of these contact areas has an electrically conductive hard material surface.

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