Methods and Apparatus for Determining Particle Characteristics by Measuring Scattered Light

• US 20070206203A1
• Filed: 04/09/2005
• Published: 09/06/2007
• Est. Priority Date: 04/10/2004
• Status: Abandoned Application

• Current Assignee: Michael Trainer
• Original Assignee: Michael Trainer
• Inventors: Trainer, Michael
• Application Number:
  US10/599,737
• Publication Number:
  US 20070206203A1
• Time in Patent Office: Days
• US Class Current: 356/521
• CPC Class Codes: G01B 11/08 for measuring diameters
• CPC Class Codes: G01N 15/0205 by optical means
• CPC Class Codes: G01N 15/0211 Investigating a scatter or diffraction pattern
• CPC Class Codes: G01N 15/0255 with mechanical, e.g. inertial, classification, and investigation of sorted collections with centrifuges G01N15/042
• CPC Class Codes: G01N 15/042 by centrifuging and investigating centrifugates centrifuges per se B04B
• CPC Class Codes: G01N 2015/0216 from fluctuations of diffraction pattern
• CPC Class Codes: G02B 6/32 having lens focusing means positioned between opposed fibre ends with lens being an integral part of the single fibre end G02B6/262

Abstract

An instrument for measuring the size and characteristics of a particle contained in a sample of particles. A particle sample is introduced into a sample chamber. The sample particles are subjected to centrifugal forces so that large particles travel in the sample chamber at velocities greater than small particles. Light is shown upon the particles as they travel in the sample chamber. The particles diffract the light. The diffracted light is then received by detectors that convert the diffracted light into corresponding electronic signals. The electronic signals are analyzed to determine the size and characteristics of the particles that caused the diffracted light.

Claims

1. A method of determining the size of particles in a particle sample, said method comprising the steps of:

providing a sample chamber;

providing a laser light source that produces a beam of laser light;

passing said particle sample into said sample chamber;

subjecting said particle sample to centrifugal force while in said sample chamber;

directing said beam of laser light into said sample chamber, wherein said beam of laser light is diffracted by at least one particle contained in said particle sample, therein causing diffracted light to emanate from said sample chamber;

providing at least one detector that converts light into corresponding electronic signals, wherein least some of said diffracted light is received by said at least one detector array;

determining the size of said at least one particle that caused said diffracted light by analyzing said electronic signals generated by said at least one detector array.