Systems, devices, and methods for arc fault management

• US 20070208520A1
• Filed: 03/01/2006
• Published: 09/06/2007
• Est. Priority Date: 03/01/2006
• Status: Abandoned Application

• Current Assignee: Siemens Industry Incorporated (Siemens AG)
• Original Assignee: Siemens Energy & Automation Incorporated (Siemens AG)
• Inventors: Zhang, Bin, Restrepo, Carlos, Golod, Mikhail, Shields, Sandra
• Application Number:
  US11/365,714
• Publication Number:
  US 20070208520A1
• Time in Patent Office: Days
• US Class Current: 702/58
• CPC Class Codes: H02H 1/0015 Using arc detectors
• CPC Class Codes: H02H 3/335 the main function being self testing of the device

Abstract

Certain exemplary embodiments can comprise a fault detection system, which can comprise a microprocessor. The microprocessor can be configured to automatically generate an output signal to an output pin responsive to an input signal indicative of an arc fault. The output signal can be configured to trip a circuit breaker.

Claims

1. A fault detection system comprising:

a single-circuit breaker dedicated microprocessor configured to;

automatically generate an output signal to an output pin responsive to an input signal indicative of an arc fault, said output signal configured to trip a single circuit breaker; and

detect corruption in code comprised in said microprocessor, said code associated with said output signal.

2. The system of claim 1, further comprising:

a light emitting diode indicator configured to indicate a run status of said microprocessor

3. The system of claim 1, further comprising:

a resistive current sensor electrically coupled to said microprocessor.

4. The system of claim 1, further comprising:

a differential current sensor electrically coupled to said microprocessor.

5. The system of claim 1, further comprising:

a device configured to trip an electrical circuit associated with said fault detection system.

6. The system of claim 1, further comprising:

a temperature sensor configured to provide a temperature value for correcting a measured value of a current sensor electrically coupled to said microprocessor.

7. The system of claim 1, further comprising:

a temperature sensor configured to provide a temperature value for correcting a measured value of a current sensor electrically coupled to said microprocessor; and

an analog to digital converter configured to accept an analog input from said current sensor and provide a digital output to said microprocessor.

8. The system of claim 1, further comprising:

an amplifier configured to amplify an analog signal from a current sensor, said amplifier electrically coupled to said microprocessor.

9. The system of claim 1, further comprising:

an analog to digital converter configured to accept an analog input from a current sensor electrically coupled to said microprocessor and provide a digital output to said microprocessor.

10. The system of claim 1, further comprising:

an analog to digital converter configured to accept an analog input from a differential current sensor and provide a digital output to said microprocessor.

11. The system of claim 1, further comprising:

a power supply configured to provide electrical energy to said microprocessor.

12. The system of claim 1, further comprising:

a plurality of resistors configured to set a gain of an amplifier comprised in said fault detection system and set a signal output of said amplifier at a predetermined level in a predetermined direct current voltage range before said signal output is received by an analog to digital converter.

13. The system of claim 1, said microprocessor further configured to:

provide a simulated arc fault signal to test said fault detection system.

14. The system of claim 1, said microprocessor further configured to:

automatically calibrate a current sensor and a differential current sensor comprised in said fault detection system.

15. The system of claim 1, said microprocessor further configured to:

receive a user request to calibrate a current sensor and a differential current sensor electrically coupled to said microprocessor.

16. The system of claim 1, said microprocessor further configured to:

provide a simulated signal indicative of a ground fault to test said fault detection system.

17. The system of claim 1, said microprocessor further configured to:

receive said input signal indicative of an arc fault from a current sensor electrically coupled to said microprocessor.

18. The system of claim 1, said microprocessor further configured to:

receive a signal indicative of a ground fault from a differential current sensor electrically coupled to said microprocessor.

19. The system of claim 1, said microprocessor further configured to:

automatically calibrate a gain of an analog to digital converter electrically coupled to a current sensor electrically coupled to said microprocessor.

20. The system of claim 1, said microprocessor further configured to:

automatically correct a value obtained from a current sensor electrically coupled to said microprocessor based upon a measured temperature.

21. The system of claim 1, said microprocessor further configured to:

automatically correct a value obtained from a differential current sensor electrically coupled to said microprocessor based upon a measured temperature.

22. A method comprising:

configuring a microprocessor to.

automatically generate an output signal to an output pin responsive to an input signal indicative of an arc fault, said output signal configured to trip a single circuit breaker; and

detect corruption in code comprised in said microprocessor, said code associated with said output signal.

23. A machine-readable medium comprising machine instructions for activities comprising:

automatically generating an output signal to an output pin responsive to an input signal indicative of an arc fault, said output signal configured to trip a single circuit breaker; and

detecting corruption in code comprised in a microprocessor, said code associated with said output signal.