IN-LINE QUADRATURE AND ANTI-REFLECTION ENHANCED PHASE QUADRATURE INTERFEROMETRIC DETECTION

• US 20070212257A1
• Filed: 02/15/2007
• Published: 09/13/2007
• Est. Priority Date: 02/16/2006
• Status: Abandoned Application

• Current Assignee: Purdue Research Foundation (The Trustees of Purdue University (d/b/a Purdue University))
• Original Assignee: Purdue Research Foundation (The Trustees of Purdue University (d/b/a Purdue University))
• Inventors: Varma, Manoj, Zhao, Ming, Nolte, David
• Application Number:
  US11/675,359
• Publication Number:
  US 20070212257A1
• Time in Patent Office: Days
• US Class Current: 422/57
• CPC Class Codes: G01N 2021/4707 Forward scatter; Low angle scatter
• CPC Class Codes: G01N 2021/7773 Reflection
• CPC Class Codes: G01N 2021/7779 interferometric
• CPC Class Codes: G01N 21/253 for batch operation, i.e. multisample apparatus analytical automats G01N35/00
• CPC Class Codes: G01N 21/45 using interferometric methods; using Schlieren methods
• CPC Class Codes: G01N 21/47 Scattering, i.e. diffuse reflection G01N21/25, G01N21/41 take precedence G01N21/55 takes precedence
• CPC Class Codes: G01N 21/75 Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated systems in which material is burnt in a flame or plasma G01N21/72, G01N21/73
• CPC Class Codes: G01N 21/77 by observing the effect on a chemical indicator
• CPC Class Codes: G01N 33/54373 involving physiochemical end-point determination, e.g. wave-guides, FETS, gratings

Abstract

Method and apparatus for use with a probe beam and detector for detecting the presence of a target analyte in a sample. The apparatus includes a substrate; and a biolayer located on the substrate designed to react to target analyte when the sample is deposited on the biolayer. The substrate can be selected to substantially minimize reflectance by the substrate while substantially maintaining scattering by the target analyte. The substrate can be designed so waves reflected by the substrate are substantially in quadrature with waves scattered by target analyte; or so waves reflected by the substrate and scattered by target analyte interfere in the far field and directly create intensity modulation detectable by the detector. The biolayer can include a plurality of spots, and the spots can be grouped into unit cells having specific antibodies and non-specific antibodies for reacting with target analyte.

Claims

1. An apparatus for use with a probe beam and a detector that detects the probe beam waves for detecting the presence of a target analyte in a sample, the apparatus comprising:

a substrate;

a biolayer designed to react to the target analyte when the sample is deposited on the biolayer, the biolayer being located on the substrate;

wherein the substrate is selected to substantially minimize the reflectance of the probe beam waves by the substrate while substantially maintaining the scattering of the probe beam waves by the target analyte.

2. The apparatus of claim 1, wherein the substrate is designed such that the probe beam waves reflected by the substrate are substantially in quadrature with the probe beam waves scattered by the target analyte.

3. The apparatus of claim 1, wherein the substrate is designed such that the probe beam waves reflected by the substrate and the probe beam waves scattered by the target analyte interfere in the far field and directly create intensity modulation detectable by the detector.

4. The apparatus of claim 3, wherein the substrate is designed such that the probe beam waves scattered by the target analyte interfere constructively in the far field with the probe beam waves reflected by the substrate to increase intensity modulation, and the probe beam waves scattered by a dust particle on the substrate produce an intensity decrease in the far field.

5. The apparatus of claim 1, wherein the substrate is designed such that the probe beam waves scattered by the target analyte are substantially in-phase with the probe beam waves reflected by the substrate.

6. The apparatus of claim 1, wherein the biolayer comprises a plurality of spots deposited on the substrate, and the detector detects when the target analyte reacts with one of the plurality of spots.

7. The apparatus of claim 6, wherein the plurality of spots are grouped into unit cells, each unit cell comprising spots having specific antibodies and spots having non-specific antibodies.

8. The apparatus of claim 7, wherein each unit cell is a two-by-two array of spots having a first diagonal and a second diagonal, the first diagonal comprising a pair of spots having specific antibodies and the second diagonal comprising a pair of spots having non-specific antibodies.

9. The apparatus of claim 8, wherein the detector provides a reading for each of the plurality of spots in the unit cell and a diagonal difference is computed, the diagonal difference being the sum of the readings from the pair of spots on the second diagonal having non-specific antibodies subtracted from the sum of the readings for the pair of spots on the first diagonal having specific antibodies and the computed difference being divided by the sum of the readings from all four spots.

10. The apparatus of claim 1, wherein the apparatus is a disc.

11. The apparatus of claim 1, wherein the probe beam is a substantially monochromatic laser and the apparatus further comprises:

an objective lens for collecting a target signal, the target signal comprising the probe beam waves scattered by the target analyte and the probe beam waves reflected by the substrate; and

a beam splitter for directing the target signal to the detector.

12. The apparatus of claim 11, further comprising a spinning mechanism, wherein the substrate is spun by the spinning mechanism such that the probe beam waves hit the substrate and the sample as they are spinning, and the reflected and scattered probe beam waves impinge on the objective lens.

13. The apparatus of claim 12, wherein the apparatus is designed to reduce system noise such that relative intensity noise dominates system noise.

14. The apparatus of claim 13, wherein the biolayer comprises a plurality of spots grouped into unit cells, each unit cell comprising spots having specific antibodies and spots having non-specific antibodies.

15. The apparatus of claim 1, wherein the detector is a split detector having a left half output and a right half output and the difference between the left half output and the right half output is used for detecting the presence of the target analytes.

16. The apparatus of claim 1, wherein the detector is a quadrant detector having a total intensity output and two difference outputs and only the total intensity output is used for detecting the presence of the target analytes.

17. The apparatus of claim 1, wherein the detector is a multi-output detector having a total intensity output and a difference output, the total intensity output being usable to compute an in-line quadrature reading and the difference output being usable to compute a differential phase contrast reading.

18. The apparatus of claim 17, wherein the in-line quadrature reading and the differential phase contrast reading are summed in quadrature for detecting the presence of the target analyte.

19. The apparatus of claim 1, wherein the substrate comprises:

a base material, and

a support layer having a top support surface, a bottom support surface and a support layer thickness which is the distance between the top support surface and the bottom support surface, the support layer being located on the base material such that the bottom support surface is adjacent to the base material, and the biolayer being located on the top support surface.

20. The apparatus of claim 19, wherein the support layer is selected such that the refractive index of the support layer substantially minimizes reflectance of the probe beam waves by the top support surface and by the base material.

21. The apparatus of claim 20, wherein the support layer thickness is selected to tune the phase of the probe beam waves reflected by the top support surface and the probe beam waves reflected by the base material to bring them substantially into one of phase quadrature or in-phase.

22. The apparatus of claim 19, wherein the support layer thickness is selected such that the probe beam waves reflected by the top support surface are substantially in quadrature with the probe beam waves reflected by the base material.

23. The apparatus of claim 19, wherein the support layer thickness is approximately N*λ

/4, where λ

is the wavelength of the probe beam waves and N is an odd integer.

24. The apparatus of claim 19, wherein the support layer thickness is selected such that the probe beam waves reflected by the top support surface are substantially in phase with the probe beam waves reflected by the base material.

25. The apparatus of claim 19, wherein the support layer thickness is approximately N*λ

/8, where λ

is the wavelength of the probe beam waves and N is an odd integer.

26. The apparatus of claim 19, wherein the support layer thickness is selected to be between the optimum thickness for in-line quadrature detection and the optimum thickness to maximize electric field strength at the top support surface, inclusively.

27. The apparatus of claim 19, wherein the support layer thickness is approximately 0.2*λ

where λ

is the wavelength of the probe beam waves.

28. The apparatus of claim 19, wherein the support layer thickness is selected such that the probe beam waves scattered by the target analyte interfere constructively in the far field with the probe beam waves reflected by the substrate to increase intensity modulation, and the probe beam waves scattered by a dust particle on the support layer cause an intensity decrease in the far field.

29. The apparatus of claim 19, wherein the support layer thickness is approximately 0.3*λ

, where λ

is the wavelength of the probe beam waves.

30. The apparatus of claim 19, wherein the base layer and support layer materials are selected such that for the base material having a refractive index of n*n, the support layer is selected to have a refractive index of approximately n.

31. The apparatus of claim 19, wherein the base material is glass and the support layer is a thin layer of gold.

32. The apparatus of claim 31, wherein the thickness of the layer of gold is approximately 3 nm.

33. The apparatus of claim 19, wherein the support layer comprises quarter wave layers on the substrate designed to substantially minimize the reflectance of the probe beam waves by the substrate.

34. The apparatus of claim 19, wherein the support layer is MgF and the base material is ZrO₂.

35. The apparatus of claim 19, wherein the base material is silicon (Si) and the support layer is silicon dioxide (SiO₂).

36. A method for detecting the presence of a target analyte in a sample, the method comprising:

providing a substrate including a plurality of analyzer molecules distributed about the substrate;

contacting the sample to at least a portion of the analyzer molecules on the substrate;

scanning the substrate with waves from a probe beam;

collecting a target signal including probe beam waves reflected and scattered by the substrate and the sample; and

determining one of the presence or the absence of the target analyte in the sample directly from the intensity modulation of the target signal.

37. The method of claim 36, wherein the collecting step comprises.

collecting the probe beam waves scattered by the target analyte;

and

collecting the probe beam waves reflected by the substrate.

38. The method of claim 37, wherein the probe beam waves scattered by the target analyte are substantially in-phase with the probe beam waves reflected by the substrate.

39. The method of claim 38, wherein the substrate is designed such that the probe beam waves scattered by the target analyte interfere constructively in the far field with the probe beam waves reflected by the substrate to increase intensity modulation, and the probe beam waves scattered by a dust particle on the substrate cause an intensity decrease in the far field.

40. The method of claim 36, wherein the scanning step further comprises:

placing the substrate on a spinning platform; and

spinning the substrate and the sample so the substrate is scanned by the probe beam.

41. The method of claim 36, wherein the plurality of analyzer molecules are distributed about the substrate in a plurality of spots organized into unit cells, and wherein each unit cell includes a two-by-two array of spots having a first diagonal and a second diagonal, the two spots on the first diagonal of the array being designed to react strongly with the target analyte, and the two spots on the second diagonal of the array being designed not to react strongly with the target analyte.

42. The method of claim 41, wherein the determining step further comprises:

taking measurements of the intensity signal from each spot; and

for each unit cell;

computing a first diagonal sum as the sum of the measurements from the two spots on the first diagonal;

computing a second diagonal sum as the sum of the measurements from the two spots on the second diagonal; and

taking the difference of the first diagonal sum and the second diagonal sum.

43. The method of claim 36, wherein the determining step further comprises:

measuring an in-line quadrature reading directly from the intensity modulation of the target signal;

measuring a differential phase contrast reading; and

computing a sum in quadrature of the in-line quadrature reading and the differential phase contrast reading.

44. The method of claim 36, further comprising:

pre-scanning the substrate prior to the contacting step;

making a pre-scan image of at least a portion of the analyzer molecules from the data collected in the pre-scanning step;

making a post-scan image of substantially the same portion of the analyzer molecules included in the pre-scan image;

registering the post-scan image with the pre-scan image;

making a difference image of the difference between the registered pre-scan image and post-scan image; and

using the difference image in the determining step.

45. A method of designing a platform for detecting the presence of a target analyte in a sample, the method comprising:

providing a substrate;

depositing a plurality of target spots on the substrate;

depositing a plurality of reference spots on the substrate, each of the plurality of target spots being configured to react relatively strongly with the target analyte and each of the plurality of reference spots being configured to react relatively weakly with the target analyte;

grouping the plurality of target spots and the plurality of reference spots into unit cells, each unit cell comprising at least one target spot and at least one reference spot.

46. The method of claim 45, wherein each of the plurality of target spots include specific antibodies designed to specifically bind with the target analyte and the plurality of reference spots include non-specific antibodies not designed to specifically bind with the target analyte.

47. The method of claim 45, wherein each unit cell is a two-by-two array of spots having a first diagonal and a second diagonal, the first diagonal comprising two target spots and the second diagonal comprising two reference spots.

48. The method of claim 45, wherein the providing step further comprises:

providing a base material,

providing a support layer having a top support surface, a bottom support surface and a support layer thickness which is the distance between the top support surface and the bottom support surface;

positioning the support layer on the base material such that the bottom support surface of the support layer is adjacent to the base material; and

conditioning the support layer to accept the plurality of target spots and the plurality of reference spots.

49. The method of claim 48, further comprising:

selecting the support layer and the base material combination to substantially minimize reflectance of the probe beam waves by the top support surface and by the base material.

50. The method of claim 48, further comprising:

selecting the support layer thickness to tune the phase of the probe beam waves reflected by the top support surface and the probe beam waves reflected by the base material to bring them substantially into one of phase quadrature or in-phase.

51. The method of claim 48, further comprising:

selecting the base material and the support layer such that for the base material having a refractive index of n*n, the support layer is selected to have a refractive index of approximately n.

52. The method of claim 48, further comprising:

making the support layer thickness approximately the thickness at which the probe beam waves reflected by the top support surface are substantially in quadrature with the probe beam waves reflected by the base material.

53. The method of claim 48, further comprising:

making the support layer thickness approximately the thickness at which the probe beam waves reflected by the substrate and the probe beam waves scattered by the target analyte interfere in the far field and directly create intensity modulation detectable by the detector.

54. The method of claim 48, further comprising:

making the support layer thickness approximately N*λ

/4, where λ

is the wavelength of the probe beam waves and N is an odd integer.

55. The method of claim 48, further comprising:

making the support layer thickness approximately the thickness at which the probe beam waves scattered by the target analyte interfere constructively in the far field with the probe beam waves reflected by the substrate to increase intensity modulation, and the probe beam waves scattered by a dust particle on the substrate decrease intensity in the far field.

56. The method of claim 48, further comprising:

making the support layer thickness approximately the thickness at which the probe beam waves scattered by the target analyte are substantially in-phase with the probe beam waves reflected by the substrate.

57. The method of claim 48, further comprising:

making the support layer thickness approximately N*λ

/8, where λ

is the wavelength of the probe beam waves and N is an odd integer.

58. The method of claim 48, further comprising:

making the support layer thickness between the optimum thickness for in-line quadrature detection and the optimum thickness to maximize electric field strength at the top support surface, inclusive.

59. The method of claim 48, further comprising:

making the support layer thickness approximately 0.2*λ

, where λ

is the wavelength of the probe beam waves.

60. The method of claim 48, further comprising:

making the support layer thickness such that the probe beam waves scattered by the target analyte interfere constructively in the far field with the probe beam waves reflected by the substrate to increase intensity modulation, and the probe beam waves scattered by a dust particle on the support layer cause an intensity decrease in the far field.

61. The method of claim 48, further comprising:

making the support layer thickness approximately 0.3*λ

, where λ

is the wavelength of the probe beam waves.