Sensing device employing electromagnetic waves

• US 20070215810A1
• Filed: 03/14/2007
• Published: 09/20/2007
• Est. Priority Date: 03/17/2006
• Status: Active Grant

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Itsuji, Takeaki, Kurosaka, Ryoji
• Granted Patent: US 7,498,577 B2
• Time in Patent Office: Days
• US Class Current: 250/358.100
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation
• CPC Class Codes: G01N 2201/10 Scanning

Abstract

A sensing device includes a transmission path, an electromagnetic-wave input unit through which an electromagnetic wave enters the transmission path, an electromagnetic-wave detector configured to detect the electromagnetic wave propagating through the transmission path, and a bent portion provided in the transmission path. The electromagnetic wave propagates through the transmission path while radiating to the periphery of the transmission path. The bent portion is provided in the transmission path for allowing an interaction to occur between a test subject and the electromagnetic wave in the transmission path. When the test subject is positioned relative to the bent portion, the electromagnetic-wave detector detects a change in the state of the electromagnetic wave caused by the interaction occurring between the test subject and the electromagnetic wave in the bent portion. The detected information provides a basis for obtaining information on the test subject.

Claims

1. A sensing device comprising:

a transmission path through which an electromagnetic wave propagates while radiating to the periphery of the transmission path;

an electromagnetic-wave input unit through which the electromagnetic wave enters the transmission path;

an electromagnetic-wave detector configured to detect the electromagnetic wave propagating through the transmission path; and

a bent portion provided in the transmission path for allowing an interaction to occur between a test subject and the electromagnetic wave in the transmission path,

wherein when the test subject is positioned near the bent portion, the electromagnetic-wave detector detects a change in a state of the electromagnetic wave caused by the interaction occurring between the test subject and the electromagnetic wave in the bent portion, the detected change providing a basis for obtaining information on the test subject.

2. The sensing device according to claim 1, wherein a distance between the bent portion of the transmission path and an area of the test subject that is closest to the bent portion is set substantially equal to or less than the wavelength of the electromagnetic wave.

3. The sensing device according to claim 1, wherein the transmission path is given a coating.

4. The sensing device according to claim 1, wherein the bent portion is provided with a spacer that sets the distance between the bent portion of the transmission path and the test subject.

5. The sensing device according to claim 1, further comprising an angle modulation unit configured to modulate a bent angle of the bent portion.

6. The sensing device according to claim 1, wherein the transmission path comprises a single line.

7. The sensing device according to claim 1, wherein the frequency of the electromagnetic wave is within a range of 30 GHz to 30 THz.

8. The sensing device according to claim 1, further comprising a scanning unit configured to scan areas of interaction between the test subject and the bent portion occurring at the bent portion.

9. An imaging apparatus comprising:

the sensing device according to claim 8; and

a circuit system that performs imaging of the test subject,

wherein when the test subject is positioned near the bent portion, the scanning unit scans the interaction areas while the electromagnetic-wave detector detects a change in the state of the electromagnetic wave caused by the interaction between the test subject and the electromagnetic wave occurring at the bent portion, wherein the circuit system obtains information on the test subject in each interaction area on the basis of the detected change, and wherein the imaging of the test subject is performed on the basis of the obtained information.