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Semiconductor integrated circuit and system guaranteeing proper operation under low-temperature condition

  • US 20070216376A1
  • Filed: 08/17/2006
  • Published: 09/20/2007
  • Est. Priority Date: 03/20/2006
  • Status: Abandoned Application
First Claim
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1. A semiconductor integrated circuit, comprising:

  • a measurement circuit configured to detect a measuring quantity dependent on temperature; and

    a heating circuit configured to generate heat in response to a detection, by the measurement circuit, of the measuring quantity indicating that the temperature is lower than a predetermined level.

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