Method and apparatus for predicting the reliability of electronic systems
First Claim
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1. An apparatus for predicting the reliability of an electronic system comprising at least one component, the apparatus comprising:
- an acceleration sensor operable to measure acceleration of the at least one component;
a resistance sensor operable to measure an electrical resistance of the at least one component; and
an electronic control system coupled to the acceleration sensor and resistance sensor operable to predict the reliability of the electronic system using the acceleration and electrical resistance of the at least one component.
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Abstract
An apparatus for predicting the reliability of an electronic system is provided. The apparatus includes at least one component, a stress sensor operable to measure stress of the at least one component, a resistance sensor operable to measure an electrical resistance of the at least one component, and an electronic control system coupled to the stress sensor and resistance sensor operable to predict the reliability of the electronic system using the stress and electrical resistance of the at least one component.
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Citations
26 Claims
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1. An apparatus for predicting the reliability of an electronic system comprising at least one component, the apparatus comprising:
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an acceleration sensor operable to measure acceleration of the at least one component;
a resistance sensor operable to measure an electrical resistance of the at least one component; and
an electronic control system coupled to the acceleration sensor and resistance sensor operable to predict the reliability of the electronic system using the acceleration and electrical resistance of the at least one component. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for predicting the reliability of an electronic system under stress, the method comprising:
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measuring the electrical resistance of a component of the electronic system over a time period;
determining changes in electrical resistance of the component over the time period;
measuring the acceleration of the component over the time period; and
predicting a time period that the component will remain operational before failing by comparing the change in resistance of the component and the acceleration of the component over the time period to predetermined reliability data associated with the change in resistance and acceleration. - View Dependent Claims (12, 13, 14)
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15. (canceled)
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16. (canceled)
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17. A computerized method for predicting the reliability of a first electronic system comprising:
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measuring a resistance change of a component of a representative second electronic system at time intervals until the second electronic system fails;
measuring an acceleration of the component of the second electronic system at the time intervals;
storing the resistance change measurements, acceleration measurements, and time intervals in an information storage system; and
predicting a time period that the first electronic system will remain operational before failing by;
measuring the resistance change of a component of the first electronic system at the time intervals;
measuring the acceleration of the component of the first electronic system at the time intervals; and
comparing the change in resistance of the component and the acceleration of the component of the first electronic system to the stored resistance change measurements and acceleration measurements of the component of the representative second electronic system using a computer. - View Dependent Claims (18, 19, 20, 22, 23, 24, 25, 26)
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21. (canceled)
Specification