System and method of remote care on-line monitoring

• US 20070219830A1
• Filed: 03/16/2006
• Published: 09/20/2007
• Est. Priority Date: 03/16/2006
• Status: Abandoned Application

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Warner, Adrian, Sievenpiper, Crispian
• Application Number:
  US11/384,190
• Publication Number:
  US 20070219830A1
• Time in Patent Office: Days
• US Class Current: 705/3
• CPC Class Codes: G16H 20/00 ICT specially adapted for therapies or health-improving plans, e.g. for handling prescriptions, for steering therapy or for monitoring patient compliance
• CPC Class Codes: G16H 40/67 for remote operation
• CPC Class Codes: G16H 50/20 for computer-aided diagnosis, e.g. based on medical expert systems

Abstract

A system and a method by which a clinician may monitor and communicate with a plurality of remotely located patients. This monitoring may be facilitated using a variety of communication protocols. Modular treatments and institutionally created standards are combined with clinician-provided input and decisions to provide the patient an individualized treatment regimen.

Claims

1. An electronic probe apparatus for testing electronic circuits, said apparatus includes an epoxy probe card having probe wires mounted therein and having an electrically insulating surface and further electronic components mounted on said electrically insulating surface, said components being connected to said probe wires by electrically conducting lines formed on said electrically insulating surface of said probe card, said probe card further includes a metallic stiffener ring being part of said epoxy probe card, at least one of said probe wires that is carrying a common or ground potential is electrically connected by an electrically conducting line formed on said electrically insulating surface to said metallic stiffener ring.

3. The electronic probe card apparatus of claim 1, wherein said at least one probe wire is connected to an electrically conducting layer having been applied to a bottom of said insulating surface of said epoxy probe.

2. An electronic probe apparatus for testing electronic circuits, said apparatus includes an epoxy probe card having probe wires mounted therein and having an electrically insulating surface and further having electronic components mounted on said electrically insulating surface, said components being connected to said probe wires by electrically conducting lines located on said electrically insulating surface of said probe card, wherein at least one of said probe wires is connected to an electrically conducting layer extending over or under said electrically insulating surface.

4. The electronic probe apparatus including an epoxy probe card, said epoxy probe card is mounted on a circuit board and further including at least one special probe mounted on said circuit board after said epoxy probe card has been mounted on said circuit board, said special probe has a metallic tip attached to an insulating shank, said metallic tip is used for contacting the circuit to be tested.