SYSTEM AND METHOD FOR OPTICAL SENSOR INTERROGATION

• US 20070223003A1
• Filed: 03/23/2006
• Published: 09/27/2007
• Est. Priority Date: 03/23/2006
• Status: Active Grant

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Koste, Glen, Iannotti, Joseph, Frey, Richard
• Granted Patent: US 8,379,217 B2
• Time in Patent Office: Days
• US Class Current: 356/478
• CPC Class Codes: G01B 11/18 using photoelastic elements
• CPC Class Codes: G01D 5/35312 using a Fabry Perot
• CPC Class Codes: G01D 5/35316 using a Bragg gratings

Abstract

An optical sensor interrogation system comprises: a multi-frequency optical source configured to generate an optical interrogation signal, at least one optical sensor configured to filter light at a wavelength corresponding to a value of a sensed parameter and generate an optical sensor data signal, a photodetector configured to detect a reference signal and the optical sensor data signal and generate an electrical difference frequency signal corresponding to a wavelength difference between the reference signal and the optical sensor data signal, and an electrical frequency measurement module configured to measure the electrical difference frequency.

Claims

1. An optical sensor-interrogation system comprising:

a multi-frequency optical source configured to generate an optical interrogation signal;

at least one optical sensor configured to filter light at a wavelength corresponding to a value of a sensed parameter and generate an optical sensor data signal;

a photodetector configured to detect a reference signal and the optical sensor data signal and generate an electrical difference frequency signal corresponding to a wavelength difference between the reference signal and the optical sensor data signal; and

an electrical frequency measurement module configured to measure the electrical difference frequency.

2. The optical sensor-interrogation system of claim 1, further comprising a reference sensor configured to generate the reference signal from the optical interrogation signal.

3. The optical sensor-interrogation system of claim 2, wherein the optical sensor and the reference sensor comprise fiber Bragg gratings on a single fiber.

4. The optical sensor-interrogation system of claim 1, wherein the optical sensor comprises a fiber Bragg grating.

5. The optical sensor-interrogation system of claim 1, wherein the optical sensor comprises at least one sensor selected from the group consisting of fiber Fabry Perot cavities, optical microresonators, thin film filters, acousto-optic filters and combinations thereof.

6. The optical sensor-interrogation system of claim 1, further comprising an optical signal directing element configured to direct the interrogation signal to the at least one optical sensor and direct the generated optical data signal to the photodetector.

7. The optical sensor-interrogation system of claim 6, wherein the signal directing element comprises an optical circulator or a directional coupler.

8. The optical sensor-interrogation system of claim 1, wherein the multifrequency source comprises a broadband source, a Fabry Perot laser or an external cavity laser.

9. The optical sensor-interrogation system of claim 1, wherein the frequency measurement module comprises frequency counters, frequency discriminators, binary prescalers, passive filters, combiners, power taps, voltage control oscillators, electrical splitters, RF power diodes, microcontrollers, or any combination thereof.

10. The optical sensor-interrogation system of claim 1, wherein the sensed parameter comprises magnetic field, electric current, electric field, stress, strain, pressure, or temperature, or any combination thereof.

11. An optical sensor-interrogation system comprising:

a laser source configured to generate an optical interrogation signal;

at least one optical sensor configured to filter light at a wavelength corresponding to a value of a sensed parameter and generate an optical sensor data signal;

at least one reference sensor configured to filter light at a wavelength corresponding to a value of a reference parameter and generate a reference signal;

a photodetector configured to detect the reference signal and the optical sensor data signal and generate an electrical difference frequency signal corresponding to a wavelength difference between the reference signal and the optical sensor data signal; and

an electrical frequency measurement module configured to measure the electrical difference frequency, wherein the electrical frequency measurement module comprises a series of narrow band filters.

12. The optical sensor-interrogation system of claim 11, wherein the optical interrogation signal comprises signal having a plurality of wavelengths.

13. The optical sensor-interrogation system of claim 11, wherein the laser source comprises a Fabry Perot laser or an external cavity laser.

14. The optical sensor-interrogation system of claim 11, wherein the optical sensor comprises at least one sensor selected from the group consisting of fiber Fabry Perot cavities, optical microresonators, thin film filters, acousto-optic tunable filters and combinations thereof.

15. The optical sensor-interrogation system of claim 11, wherein the electrical frequency module further comprises RF diodes, and wherein the narrow band filter outputs are coupled to the RF diodes.

21. The method of claim 12, wherein measuring the electrical frequency comprises using a prescaler in combination with a low frequency counter, wherein the prescaler downshifts the frequency of the difference frequency signal.

16. A method for optical sensor interrogation and measurement comprising:

interrogating at least one optical sensor via a multi-frequency optical interrogation signal, the at least one optical sensor configured to filter light at a wavelength corresponding to value of a sensed parameter to generate an optical sensor data signal;

detecting a reference signal and the optical sensor data signal via a single broadband photodetector, the photodetector generating an electrical difference frequency signal corresponding to the wavelength difference between the reference signal and the optical sensor data signal; and

measuring electrical frequency of the difference frequency signal.

17. The method of claim 16, further comprising generating the reference signal from the interrogation signal by filtering at the reference signal wavelength.

18. The method of claim 16, further comprising estimating an optical sensor wavelength of the at least one sensor data signal from the electrical difference frequency.

19. The method of claim 16, further comprising estimating the value of the sensed parameter from the electrical difference frequency.

20. The method of claim 16, wherein measuring the electrical frequency comprises using a high bandwidth frequency counter.

22. The method of claim 16, wherein measuring the electrical frequency comprises using a series of filters and down converters.

23. The method of claim 16, wherein the multi-frequency optical interrogation signal comprises light output from a broadband source, a Fabry-Perot or an external cavity laser.

24. The method of claim 16, wherein the multi-frequency optical interrogation signal comprises spectral lines at equally spaced wavelengths.

25. The method of claim 24, wherein measuring the electrical frequency comprises using a series of narrow band filters.

26. The method of claim 16, wherein measuring the electrical frequency comprises using a splitter in combination with a voltage control oscillator and a microcontroller.

27. The method of claim 16, wherein the sensed parameter comprises magnetic field, electric field, current, voltage, stress, strain, pressure, or temperature, or any combination thereof.