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PROBING SYSTEM FOR INTEGRATED CIRCUIT DEVICES

  • US 20070232240A1
  • Filed: 06/12/2007
  • Published: 10/04/2007
  • Est. Priority Date: 05/04/2005
  • Status: Abandoned Application
First Claim
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1. A probing system for integrated circuit devices, comprising:

  • a testing machine being comprised of a first transceiving module; and

    a wafer having a plurality of integrated circuit devices and being comprised of;

    a core circuit;

    a tag register for storing an identification of the integrated circuit device;

    a self-test circuit electrically connected to the core circuit;

    a controller configured to control the operation of the core circuit; and

    a second transceiving module configured to exchange data with the first transceiving module through a wireless communication.

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