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Test method, semiconductor device, and display

  • US 20070236244A1
  • Filed: 06/01/2007
  • Published: 10/11/2007
  • Est. Priority Date: 07/22/2003
  • Status: Abandoned Application
First Claim
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1. A test method for a semiconductor substrate in which pixel cell drive circuits each including a pixel switch and a pixel capacitor that is coupled to the pixel switch and holds pixel data are arranged in a matrix corresponding to intersections between data lines and pixel switch control lines, the method comprising:

  • a drive step of driving the data line or the pixel switch control line as a test target with a test drive signal that has a required voltage level; and

    a comparison step of comparing an output level of a potential that arises in the data line or the pixel switch control line driven by the test drive signal, with a reference level to which a certain level is assigned, and outputting a comparison result as a logical value.

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