MINIMIZING TIMING SKEW AMONG CHIP LEVEL OUTPUTS FOR REGISTERED OUTPUT SIGNALS

• US 20070236249A1
• Filed: 03/31/2006
• Published: 10/11/2007
• Est. Priority Date: 03/31/2006
• Status: Active Grant

• Current Assignee: Integrated Device Technology Incorporated (Renesas Electronics Corporation)
• Original Assignee: Integrated Device Technology Incorporated (Renesas Electronics Corporation)
• Inventors: Wong, Tak
• Granted Patent: US 7,292,064 B2
• Time in Patent Office: Days
• US Class Current: 326/37
• CPC Class Codes: G01R 31/318525 Test of flip-flops or latches
• CPC Class Codes: G01R 31/318555 Control logic
• CPC Class Codes: G01R 31/318572 Input/Output interfaces
• CPC Class Codes: H03K 19/01855 synchronous, i.e. using clock signals
• CPC Class Codes: H03K 3/356078 with synchronous operation

Abstract

A synchronous output buffer circuit which effectively moves combinational logic associated with an output enable operation, boundary scan operation, and voltage translation to a pipe that leads into a pair of output registers that operate in response to the output clock signal. The output registers may be forced to asynchronously route an input signal to an output terminal during a reset mode and during a boundary scan mode. The output registers can include a safety circuit, which prevents pull-up and pull-down devices (which drive the output signal), from turning on at the same time.

Claims

1. A synchronous output buffer circuit comprising:

a first output register configured to latch a first input signal in response to an output clock signal, and thereby provide a first output signal;

a second output register configured to latch a second input signal in response to the output clock signal, and thereby provide a second output signal;

an output driver directly connected to receive the first and second output signals from the first and second output registers, and in response drive an output signal on an output terminal of the synchronous output buffer;

combinational logic configured to provide the first and second input signals in response to a first set of signals used to implement a first output function and a second set of signals used to implement a second output function, different than the first output function, wherein the combinational logic is located entirely within one or more pipes that lead into the first and second output registers.

2. The synchronous output buffer of claim 1, wherein the output driver includes a first output circuit configured to selectively couple or de-couple a first voltage supply with the output terminal in response to the first output signal, and a second output circuit configured to selectively couple or de-couple a second voltage supply with the output terminal in response to the second output signal.

3. The synchronous output buffer circuit of claim 2, wherein the first output circuit comprises a pull-up transistor controlled by the first output signal, and coupled between the output terminal and the first voltage supply, and wherein the second output circuit comprises a pull-down transistor controlled by the second output signal, and coupled between the output terminal and the second voltage supply.

4. The synchronous output buffer of claim 1, wherein the first output function comprises a data output enable function.

5. The synchronous output buffer of claim 4, wherein the second output function comprises a boundary scan output function.

6. The synchronous output buffer of claim 5, wherein the combinational logic comprises:

a first multiplexer configured route a pull-up input signal or a boundary scan pull-up signal as the first input signal in response to a mode signal;

a second multiplexer configured to route a pull-down input signal or a boundary scan pull-down signal as the second input signal in response to the mode signal.

7. The synchronous output buffer circuit of claim 6, wherein the combinational logic includes logic configured to generate the mode signal in response to a first control signal that identifies a boundary scan mode and a normal operating mode, and a second control signal that identifies a tri-state condition in the boundary scan mode.

8. The synchronous output buffer circuit of claim 1, wherein the combinational logic includes one or more logic gates configured to generate the first and second input signals in response to a data signal and an output enable signal.

9. The synchronous output buffer circuit of claim 1, wherein the combinational logic includes one or more logic gates configured to generate the first and second input signals in response to a boundary scan data signal, a boundary scan output enable signal, and a boundary scan tri-state control signal.

10. The synchronous output buffer circuit of claim 1, wherein the output terminal is directly connected to an output connector of an integrated circuit chip.

11. The synchronous output buffer circuit of claim 1, wherein the first output register is substantially identical to the second output register.

12. The synchronous output buffer circuit of claim 1, further comprising a connection that provides the second output signal from the second output register to a feedback path within the first output register, thereby preventing the output driver from simultaneously driving the output terminal to two different states.

13. The synchronous output buffer of claim 1, wherein the first and second output registers each comprise pass-through circuitry which, when enabled, allows the first and second input signals to be routed through the first and second output registers asynchronously

14. The synchronous output buffer of claim 1, wherein the combinational logic includes a voltage translation circuit for translating one or more core voltages to one or more output voltages.

15. A synchronous output buffer circuit comprising:

a first output register configured to latch a first input signal in response to an output clock signal, and thereby provide a first data signal;

a second output register configured to latch a second input signal in response to the output clock signal, and thereby provide a second data signal;

combinational logic configured to provide the first and second data signals in response to a first set of signals used to implement a first output function, the combinational logic further configured to provide a first test signal and a second test signal in response to a second set of signals used to implement a second output function, different than the first output function, wherein the combinational logic is included entirely within one or more pipes that lead into the first and second output registers;

a first multiplexer configured to route the first data signal or the first test signal as a first output signal in response to a mode signal;

a second multiplexer configured to route the second data signal or the second test signal as a second output signal in response to the mode signal; and

an output driver directly connected to receive the first and second output signal from the first and second multiplexers, and in response drive an output signal on an output terminal of the synchronous output buffer.

16. The synchronous output buffer of claim 15, wherein the output driver includes a first output circuit configured to selectively couple or de-couple a first voltage supply with the output terminal in response to the first output signal, and a second output circuit configured to selectively couple or dc-couple a second voltage supply with the output terminal in response to the second output signal.

17. The synchronous output buffer circuit of claim 16, wherein the first output circuit comprises a pull-up transistor controlled by the first output signal, and coupled between the output terminal and the first voltage supply, and wherein the second output circuit comprises a pull-down transistor controlled by the second output signal, and coupled between the output terminal and the second voltage supply.

18. The synchronous output buffer of claim 15, wherein the first output function comprises a data output enable function.

19. The synchronous output buffer of claim 18, wherein the second output function comprises a boundary scan output function.

20. The synchronous output buffer of claim 19, wherein the combinational logic includes logic configured to generate the mode signal in response to a first control signal that identifies a boundary scan mode and a normal operating mode, and a second control signal that identifies a tri-state condition in the boundary scan mode.

21. The synchronous output buffer circuit of claim 15, wherein the combinational logic includes one or more logic gates configured to generate the first and second input signals in response to a data signal and an output enable signal.

22. The synchronous output buffer circuit of claim 15, wherein the combinational logic includes one or more logic gates configured to generate the first and second test signals in response to a boundary scan data signal, a boundary scan output enable signal, and a boundary scan tri-state control signal.

23. The synchronous output buffer circuit of claim 15, wherein the output terminal is directly connected to an output connector of an integrated circuit chip.

24. The synchronous output buffer circuit of claim 15, wherein the first output register is substantially identical to the second output register, and the first multiplexer is substantially identical to the second multiplexer.

25. The synchronous output buffer circuit of claim 15, further comprising a connection that provides the second data signal from the second output register to a feedback path within the first output register, thereby preventing the output driver from simultaneously driving the output terminal to two different states.

26. The synchronous output buffer of claim 15, wherein the first and second output registers each comprise pass-through circuitry which, when enabled, allows the first and second input signals to be routed through the first and second output registers asynchronously.

27. The synchronous output buffer of claim 15, wherein the combinational logic includes a voltage translation circuit for translating one or more core voltages to one or more output voltages.