Method of ion implanting for tri-gate devices
First Claim
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1. A method for fabrication of a semiconductor device comprising:
- ion implanting a semiconductor fin disposed on a substrate, which fin is initially disposed on a Y-axis, extends above the substrate on a Z-axis, and has a gate structure transversing the fin on a X-axis, with ions of a first conductivity type to form spaced-apart tip source and drain regions in the fin along the Y-axis, the first ion implanting occurring with the wafer twisted by approximately 90° and
tilted at an acute angle in the YZ plane; and
ion implanting, with ions of a second conductivity type to form halo regions under the gate structure.
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Abstract
A method for ion implanting a tip source and drain region and halo region for a tri-gate field-effect transistor is described. A silicon body is implanted, in one embodiment, from six different angles to obtain ideal regions.
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Citations
26 Claims
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1. A method for fabrication of a semiconductor device comprising:
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ion implanting a semiconductor fin disposed on a substrate, which fin is initially disposed on a Y-axis, extends above the substrate on a Z-axis, and has a gate structure transversing the fin on a X-axis, with ions of a first conductivity type to form spaced-apart tip source and drain regions in the fin along the Y-axis, the first ion implanting occurring with the wafer twisted by approximately 90° and
tilted at an acute angle in the YZ plane; and
ion implanting, with ions of a second conductivity type to form halo regions under the gate structure. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method for fabricating a semiconductor device comprising:
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ion implanting, a semiconductor fin disposed on a substrate, which fin is initially disposed along a Y-axis, extends above the substrate along a Z-axis, and has a gate structure transversing the fin along a X-axis, with ions of a first conductivity type to form spaced-apart tip source and drain regions in the fin along the Y-axis; and
ion implanting the semiconductor fin generally under the gate structure, with ions of a second conductivity type to form halo regions generally between the spaced-apart tip source and drain regions, the halo ion implanting occurring with the wafer twisted in the XY plane at a first acute angle, and tilted at a second acute angle in the YZ plane. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16)
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17. A method of fabricating a semiconductor device comprising:
performing one of the following steps before the other;
ion implanting a semiconductor fin disposed on a substrate, which fin is initially disposed on a Y-axis, extends above the substrate on a Z-axis, and has a gate structure transversing the fin on a X-axis, with ions of a first conductivity type to form spaced-apart tip source and drain regions in the fin along the Y-axis, the tip ion implanting occurring with the wafer twisted by approximately 90° and
tilted at a first angle in the YZ plane; and
ion implanting the semiconductor fin generally under the gate structure, with ions of a second conductivity type to form halo regions, generally between the spaced-apart tip source and drain regions, the halo ion implanting occurring with the wafer twisted in the XY plane at plus and minus a second acute angle, and tilted at a third acute angle in the YZ plane. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26)
Specification