Systems and methods for performing simultaneous tomography and spectroscopy

• US 20070239031A1
• Filed: 04/14/2006
• Published: 10/11/2007
• Est. Priority Date: 02/15/2006
• Status: Abandoned Application

• Current Assignee: University of Central Florida Research Foundation Inc. (State University System of Florida)
• Original Assignee: University of Central Florida Research Foundation Inc. (State University System of Florida)
• Inventors: Rolland, Jannick, Lee, Kye-Sung
• Application Number:
  US11/404,322
• Publication Number:
  US 20070239031A1
• Time in Patent Office: Days
• US Class Current: 600/473
• CPC Class Codes: A61B 5/0059 using light, e.g. diagnosis by transillumination, diascopy, fluorescence A61B5/0093, A61B5/1455, A61B5/02416 and A61B5/0261 take precedence
• CPC Class Codes: A61B 5/0066 Optical coherence imaging
• CPC Class Codes: A61B 5/0071 by measuring fluorescence emission
• CPC Class Codes: A61B 5/0075 by spectroscopy, i.e. measuring spectra, e.g. Raman spectroscopy, infrared absorption spectroscopy A61B5/0071 takes precedence
• CPC Class Codes: A61B 5/444 Evaluating skin marks, e.g. mole, nevi, tumour, scar
• CPC Class Codes: G01N 21/4795 spatially resolved investigating of object in scattering medium in vivo A61B
• CPC Class Codes: G01N 21/6402 Atomic fluorescence; Laser induced fluorescence
• CPC Class Codes: G01N 21/6456 Spatial resolved fluorescence measurements; Imaging

Abstract

Systems and method for performing simultaneous optical coherence tomography and spectroscopy. In one embodiment, a system includes a light source that emits light to be delivered to a material under evaluation, and a receiver that collects both light that is backscattered by features of the material and fluorescent light that is emitted by features of the material. In one embodiment, a method includes simultaneously collecting near-infrared light backscattered by a material under evaluation and fluorescent light emitted by the material under evaluation using a single light detector.

Claims

1. An imaging system, comprising

a light source that emits light to be delivered to a material under evaluation;

and

a receiver that collects both light that is backscattered by features of the material and fluorescent light that is emitted by features of the material, such that separate apparatuses are not needed to collect both the backscattered light and the fluorescent light.

2. The system of claim 1, wherein the light source is a low-coherence, near-infrared light source.

3. The system of claim 2, wherein the light source emits light having a central wavelength within the range of approximately 700 nanometers to 900 nanometers.

4. The system of claim 2, wherein the light source emits light having a central wavelength of approximately 800 nanometers.

5. The system of claim 1, wherein light emitted by the light source causes both the backscattering of light and generation of the fluorescent light, the backscattered light being in the near-infrared spectrum and the fluorescent light being in the visible spectrum.

6. The system of claim 1, wherein the receiver comprises a spectrometer that spreads the received light by wavelength and a single light detector that receives the spread light.

7. The system of claim 6, wherein the light detector comprises one of a charge-coupled device, photodiode array, or a photomultiplier array.

8. An imaging system for simultaneously performing Fourier-domain optical coherence tomography (OCT) and two-photon fluorescence spectroscopy on a material under evaluation, the system comprising:

a low-coherence, near-infrared light source that emits high-power, near-infrared light that causes both backscattering of near-infrared light from features in the material and two-photon excitation of features in the material, the two-photon excitation generating fluorescent light; and

a receiver comprising a single light detector that collects both the backscattered near-infrared light and the fluorescent light so as to enable both Fourier-domain OCT and fluorescence spectroscopy.

9. The system of claim 8, wherein the light source emits light having a central wavelength of approximately 800 nanometers such that the backscattered near-infrared has a central wavelength of approximately 800 nanometers and the fluorescent light emits in the near-infrared and visible spectrum with wavelengths ranging from approximately 350 nanometers to 700 nanometers.

10. The system of claim 8, wherein the light source is a titanium-doped sapphire laser.

11. The system of claim 8, wherein the receiver further comprises a spectrometer that spreads received light across the light detector by wavelength such that the backscattered near-infrared light is received by a portion of the light detector that is different from a portion of the light detector that receives the fluorescent light.

12. The system of claim 8, wherein the light detector comprises one of a charge-coupled device, photodiode array, or a photomultiplier array.

13. The system of claim 8, further comprising a sample path that transmits light emitted by the light source to the material and that transmits the backscattered near-infrared light and the fluorescent light to the receiver.

14. The system of claim 13, further comprising a reference path that transmits light emitted by the light source to a reference mirror and then to the receiver for the purpose of generating an interference signal resulting from combination of the backscattered near-infrared light and the near-infrared light emitted by the light source.

15. The system of claim 8, further comprising a Fourier-domain optical delay line that compensates for dispersion mismatch.

16. The system of claim 8, further comprising at least one cold mirror that transmits near-infrared light and reflects fluorescent light.

17. The system of claim 8, further comprising a dispersion compensator that compensates for chromatic dispersion.

18. The system of claim 8, further comprising a scanning mirror that modifies an angle at which light from the light source reaches an objective to enable scanning of the material under evaluation.

19. A method for performing simultaneous optical coherence tomography (OCT) and fluorescence spectroscopy, the method comprising:

exposing a material under evaluation to near-infrared light to cause both backscattering of near-infrared light from and two-photon excitation of features of the material, the two-photon excitation resulting in generation of fluorescent light;

collecting the backscattered near-infrared light and the fluorescent light with a single light detector; and

manipulating data output by the light detector.

20. The method of claim 19, simultaneous to exposing the material under evaluation, directing reference near-infrared light through a reference path and collecting the reference near-infrared light at the light detector such that the near-infrared light and the backscattered reference near-infrared light interferes with each other.

21. The method of claim 19, further comprising spreading the backscattered near-infrared light, the reference near-infrared light, and the fluorescent light by wavelength prior to collection by the light detector such that near-infrared light and fluorescent light are received by different portions of the light detector.

22. A method for evaluating a material under consideration, the method comprising:

simultaneously collecting near-infrared light backscattered by the material and fluorescent light emitted by the material using a single light detector.