TESTING SYSTEM FOR FLATNESS AND PARALLELISM

• US 20070240322A1
• Filed: 12/22/2006
• Published: 10/18/2007
• Est. Priority Date: 04/14/2006
• Status: Active Grant

• Current Assignee: FIH (Hong Kong) Limited (Hon Hai Precision Industry Co., Ltd.), Shenzhen Futaihong Precision Industrial Company Limited (Hon Hai Precision Industry Co., Ltd.)
• Original Assignee: FIH (Hong Kong) Limited (Hon Hai Precision Industry Co., Ltd.)
• Inventors: Chen, Ping, LI, LEI, Cheng, Zhi, Sun, Chang-Fa, Zhai, Xue-Liang, Sun, Ai-Ge
• Granted Patent: US 7,428,783 B2
• Time in Patent Office: Days
• US Class Current: 33/533
• CPC Class Codes: G01B 5/207 using a plurality of fixed, simultaneously operating transducers G01B5/213 - G01B5/22 take precedence
• CPC Class Codes: G01B 5/25 for testing the alignment of axes
• CPC Class Codes: G01B 5/285 for controlling eveness

Abstract

A testing system for testing flatness of a surface of a workpiece includes a testing apparatus (10) and a processor (20). The testing apparatus includes a testing box (12) and a measuring apparatus (14). The testing box includes a plurality of holders (122); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles (142) extending out of the testing box and a plurality of gauges (141) configured for measuring distance of the testing poles retracting into the testing box. Ends (1421) of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.

Claims

1. A testing system for testing flatness of a surface of a workpiece, comprising:

a testing apparatus including a testing box and a measuring apparatus;

the testing box including a plurality of holders, the holders defining a datum plane;

the measuring apparatus comprising a plurality of movable testing poles extending out of the testing box and a plurality of gauges configured for measuring distance of the testing poles retracting into the testing box, ends of the testing poles away from the testing box being located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece, the retracting distance of the testing poles being equal to distances between testing points on the surface of the workpieces and the datum plane; and

a processor being connected to the testing apparatus for receiving and processing testing data which are converted from the retracting distance of the testing poles measured by the gauges.

2. The testing system as claimed in claim 1, wherein the testing box includes a top board, wherein the holders are mounted on the top board, and top ends of the holders define the datum plane.

3. The testing system as claimed in claim 2, wherein the gauges are micrometers mounted in the testing box, each testing pole extending from a corresponding one of the micrometers through the top board and being moveable in a direction perpendicular to the datum plane.

4. The testing system as claimed in claim 3, wherein the testing apparatus includes an interface;

the micrometers are connected to the processor via the interface.

5. The testing system as claimed in claim 3, wherein the testing apparatus includes a controlling apparatus configured for adjusting positions of the testing poles to cause the ends of the testing poles away from the testing box being located at the datum plane before the workpiece is placed on the testing poles.

6. The testing system as claimed in claim 1, wherein the processor includes a display module, the display module is used to display relational data and test results.

7. A testing method for testing flatness of surfaces of workpieces, comprising steps of:

providing a testing system, the testing system including a testing apparatus and a processor;

the testing apparatus including a testing box and a measuring apparatus, the testing box including a plurality of holders, the holders defining a datum plane, the measuring apparatus configured for measuring distance between testing points on the surfaces of the workpieces and the datum plane;

the processor being connected to the testing apparatus;

setting testing parameters;

measuring distances between a plurality of testing points on the workpiece and the datum plane and recording the distances as testing data;

inputting the testing data to the processor; and

the processor processing the testing data and generating test results via comparing the testing data with the testing parameters.

8. The testing method as claimed in claim 7, wherein the testing box includes a top board, the holders are mounted in the testing box and extend out of the top board, and top ends of the holders define the datum plane.

9. The testing method as claimed in claim 8, wherein the measuring apparatus includes a plurality of micrometers mounted in the testing box, each micrometer includes a testing pole, each testing pole extends through the top board and is moveable along its axis, and top ends of all testing poles are exposed on the top board configured for contacting with the testing points of the workpieces respectively.

10. The testing method as claimed in claim 8, wherein the testing apparatus includes an interface;

the micrometers are connected to the processor via the interface.

11. The testing method as claimed in claim 9, wherein the testing apparatus includes a controlling apparatus configured for adjusting positions of the testing poles to cause the top ends of the testing poles being located at the datum plane before the workpiece is placed on the testing poles.

12. The testing method as claimed in claim 7, wherein the processor includes a display module configured for displaying relational data and test results.

13. The testing method as claimed in claim 7, wherein the testing parameter is a permissible range of a difference between testing data of any two testing points, or a permissible range of a standard deviation of all testing data.

14. A testing method for testing flatness of a surface of a workpiece via a testing system which comprises a testing box and a processor, the testing apparatus comprising a plurality of movable testing poles ends of which locate at a datum plane, the method comprising steps of:

setting testing parameters in the processor;

placing the workpiece on the testing poles to cause the ends of the testing poles respectively contacting with testing points on the surface of the workpiece so that some of the testing poles corresponding to the testing points which locate under the datum plane partly retract to the testing box under the pressure of the workpiece;

recording the retracting distances of the testing poles and converting the retracting distances into testing data;

outputting the testing data to the processor; and

the processor generating test results via comparing the testing data with the testing parameters.

15. The testing method as claimed in claim 14, wherein the testing system further comprises a plurality of holders extending out of the testing box and a checking block defining a checking plane, the datum plane being defined by distal ends of the holders at outside of the testing box, and wherein the method further comprises a step of initializing the testing system, in the initializing step the checking block is placed on the holders with the checking plane contacting with the distal ends of the holder and the testing poles are adjusted to cause all of the ends of the testing poles contacting with the checking plane.

16. The testing method as claimed in claim 15, wherein the testing system further comprises buttons mounted at an exterior surface of the testing box, a controlling apparatus which comprises a driving apparatus mounted in the testing box configured for driving the testing poles to move relative to the testing box, and a controller configured for controlling the driving apparatus to drive movement of the testing poles via pressing the buttons in the initializing step.

17. The testing method as claimed in claim 15, wherein each of the testing poles extends from a micrometer that is mounted in the testing box.