Apparatus for measuring concentration of gas

• US 20070241280A1
• Filed: 04/17/2007
• Published: 10/18/2007
• Est. Priority Date: 04/17/2006
• Status: Abandoned Application

• Current Assignee: Nihon Kohden Corporation
• Original Assignee: Nihon Kohden Corporation
• Inventors: Yamamori, Shinji, Dainobu, Hidetoshi
• Application Number:
  US11/785,341
• Publication Number:
  US 20070241280A1
• Time in Patent Office: Days
• US Class Current: 250/343
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0227 using notch filters
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08
• CPC Class Codes: G01N 21/15 Preventing contamination of the components of the optical system or obstruction of the light path
• CPC Class Codes: G01N 21/3504 for analysing gases, e.g. multi-gas analysis

Abstract

In an apparatus for measuring concentration of prescribed gas contained in subject gas, a light source is operable to emit infrared light. Airway adapter is adapted to introduce the subject gas, and to allow the infrared light emitted from the light source. A beam splitter is adapted to allow the infrared light which has passed through the airway adapter to be reflected and passed through. A first detector is operable to detect the infrared light which has reflected by the beam splitter. A second detector is operable to detect the infrared light which has passed through the beam splitter. An interference-type notch filter is disposed between the beam splitter and either the first detector or the second detector, the notch filter being adapted to cut a wavelength range of light which is absorbed by the prescribed gas.

Claims

1. An apparatus for measuring concentration of prescribed gas contained in subject gas, comprising:

a light source, operable to emit infrared light;

airway adapter, adapted to introduce the subject gas, and to allow the infrared light emitted from the light source;

a beam splitter, adapted to allow the infrared light which has passed through the airway adapter to be reflected and passed through;

a first detector, operable to detect the infrared light which has reflected by the beam splitter;

a second detector, operable to detect the infrared light which has passed through the beam splitter; and

an interference-type notch filter, disposed between the beam splitter and either the first detector or the second detector, the notch filter being adapted to cut a wavelength range of light which is absorbed by the prescribed gas.

2. The apparatus as set forth in claim 1, further comprising:

a first band-pass filter, disposed between the light source and the beam splitter, and adapted to allow a first wavelength range of light to pass through, wherein;

a center wavelength of the first wavelength range is 4.3 μ

m.

3. The apparatus as set forth in claim 2, further comprising:

a second band-pass filter, disposed between the beam splitter and the first detector, and adapted to allow a second wavelength range of light to pass through, wherein;

the notch filter is disposed between the beam splitter and the second detector.

4. The apparatus as set forth in claim 2, further comprising:

a second band-pass filter, disposed between the beam splitter and the second detector, and adapted to allow a second wavelength range of light to pass through, wherein;

the notch filter is disposed between the beam splitter and the first detector.

5. The apparatus as set forth in claim 1, further comprising:

a first band-pass filter, disposed between the notch filter and either the second detector or the beam splitter, and adapted to allow a first wavelength range of light to pass through; and

a second band-pass filter, disposed between the beam splitter and the first detector, and adapted to allow a second wavelength range of light to pass through, wherein;

the notch filter is disposed between the beam splitter and the second detector.

6. The apparatus as set forth in claim 1, further comprising:

a first band-pass filter, disposed between the notch filter and either the first detector or the beam splitter, and adapted to allow a first wavelength range of light to pass through; and

a second band-pass filter, disposed between the beam splitter and the second detector, and adapted to allow a second wavelength range of light to pass through, wherein;

the notch filter is disposed between the beam splitter and the first detector.

7. The apparatus as set forth in claim 3, wherein:

a bandwidth of the first wavelength range is 120-300 nm;

a center wavelength of the second wavelength range is 4.3 μ

m; and

a bandwidth of the second wavelength range is narrower than the bandwidth of the first wavelength range.

8. The apparatus as set forth in claim 4, wherein:

a bandwidth of the first wavelength range is 120-300 nm;

a center wavelength of the second wavelength range is 4.3 μ

m; and

a bandwidth of the second wavelength range is narrower than the bandwidth of the first wavelength range.

9. The apparatus as set forth in claim 5, wherein:

a bandwidth of the first wavelength range is 120-300 nm;

a center wavelength of the second wavelength range is 4.3 μ

m; and

a bandwidth of the second wavelength range is narrower than the bandwidth of the first wavelength range.

10. The apparatus as set forth in claim 6, wherein:

a bandwidth of the first wavelength range is 120-300 nm;

a center wavelength of the second wavelength range is 4.3 μ

m; and

a bandwidth of the second wavelength range is narrower than the bandwidth of the first wavelength range.

11. The apparatus as set forth in claim 3, wherein:

the bandwidth of the second wavelength range is 10-110 nm.

12. The apparatus as set forth in claim 4, wherein:

the bandwidth of the second wavelength range is 10-110 nm.

13. The apparatus as set forth in claim 5, wherein:

the bandwidth of the second wavelength range is 10-110 nm.

14. The apparatus as set forth in claim 6, wherein:

the bandwidth of the second wavelength range is 10-110 nm.

15. The apparatus as set forth in claim 1, wherein:

the airway adapter comprises windows through which the infrared light emitted form the light source passes; and

anti-fogging treatment is provided on the windows.

16. An apparatus for measuring concentration of prescribed gas contained in subject gas, comprising:

a light source, operable to emit infrared light;

airway adapter, adapted to introduce the subject gas, and to allow the infrared light emitted from the light source;

a detector, operable to detect infrared light;

an interference-type notch filter, provided on the chopper and adapted to cut a wavelength range of light which is absorbed by the prescribed gas; and

a chopper, provided with the notch filter and disposed between the airway adapter and the detector, the chopper operable to cause the infrared light which has passed through the airway adapter to pass through the notch filter intermittently.

17. The apparatus as set forth in claim 16, further comprising:

a first band-pass filter, disposed between the light source and the detector, and adapted to allow a first wavelength range of light to pass through.

18. The apparatus as set forth in claim 17, further comprising:

a second band-pass filter, provided on the chopper and adapted to allow a second wavelength range of light to pass through.

19. The apparatus as set forth in claim 16, further comprising:

a first band-pass filter, provided on the chopper, and adapted to allow a first wavelength range of light to pass through; and

a second band-pass filter, provided on the chopper, and adapted to allow a second wavelength range of light to pass through, wherein;

the notch filter and the first band-pass filter are aligned on the same optical path of the infrared light.

20. The apparatus as set forth in claim 16, wherein:

the airway adapter comprises windows through which the infrared light emitted form the light source passes; and

anti-fogging treatment is provided on the windows.