METHODS AND APPARATUS FOR DETERMINING CHARACTERISTICS OF PARTICLES

• US 20070242269A1
• Filed: 10/04/2006
• Published: 10/18/2007
• Est. Priority Date: 03/06/2004
• Status: Abandoned Application

• Current Assignee: Michael Trainer
• Original Assignee: Michael Trainer
• Inventors: Trainer, Michael
• Application Number:
  US11/538,669
• Publication Number:
  US 20070242269A1
• Time in Patent Office: Days
• US Class Current: 356/336
• CPC Class Codes: G01N 15/0205 by optical means
• CPC Class Codes: G01N 15/1433 using image recognition
• CPC Class Codes: G01N 15/1459 the analysis being performed on a sample stream
• CPC Class Codes: G01N 2015/0222 from dynamic light scattering, e.g. photon correlation spectroscopy
• CPC Class Codes: G01N 2015/025 Methods for single or grouped particles
• CPC Class Codes: G01N 2015/1486 Counting the particles
• CPC Class Codes: G01N 2015/1493 Particle size
• CPC Class Codes: G01N 2015/1497 Particle shape
• CPC Class Codes: G01N 2021/4707 Forward scatter; Low angle scatter
• CPC Class Codes: G01N 21/53 within a flowing fluid, e.g. smoke

Abstract

An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range. If all of the particles pass through a single beam, then many small particles must be counted for each large one because typical distributions are uniform on a particle volume basis, and the number distribution is related to the volume distribution by the particle diameter cubed.

Claims

1. A method of determining characteristics of particles in a particle sample, comprising:

providing a sample chamber,

providing a laser light source that produces a beam of laser light,

passing said particle sample through said sample chamber,

focusing said beam of laser light to a specific point in said sample chamber, wherein said beam of laser light is diffracted by at least one particle passing through said specific point, therein causing diffracted light to emanate from said specific point,

providing at least one detector array that converts light into corresponding electronic signals,

providing at least one lens that is focused at said specific point in said sample chamber, wherein said at least one lens directs at least some of said diffracted light onto said at least one detector array,

determining a characteristic of said at least one particle that caused said diffracted light by analyzing said electronic signals generated by said at least one detector array,

wherein the passing step includes the step of preventing particles from reaching the beam except in a vicinity of a focal point of the beam.

2. The method of claim 1, wherein the preventing step comprises positioning a transparent member around at least a portion of the beam so as to prevent particles from reaching said portion of the beam.

3. Apparatus for determining characteristics of particles in a particle sample, comprising:

a sample chamber,

a laser light source that produces a beam of laser light,

means for passing said particle sample through said sample chamber,

means for focusing said beam of laser light to a specific point in said sample chamber, wherein said beam of laser light is diffracted by at least one particle passing through said specific point, therein causing diffracted light to emanate from said specific point,

at least one detector array that converts light into corresponding electronic signals,

at least one lens that is focused at said specific point in said sample chamber, wherein said at least one lens directs at least some of said diffracted light onto said at least one detector array,

means for determining a characteristic of said at least one particle that caused said diffracted light by analyzing said electronic signals generated by said at least one detector array,

wherein the passing means comprises a transparent member which is positioned around at least a portion of the beam so as to prevent particles from reaching the beam except in a vicinity of a focal point of the beam.