Application Specific Distributed Test Engine Architecture System And Method
First Claim
1. A distributed test system for testing one or more devices under test including a first device under test, wherein said devices under test include integrated circuits, the distributed test system comprising:
- a first application specific test engine (ASTE) that generates first test signals for the first device under test, wherein the first ASTE is programmable in the testing environment to enable modification of said first test signals based upon a type of said first device under test;
an existing test unit to generate a defined set of defined test signals; and
a switch matrix including a first switch for connecting the first device under test to one of the first ASTE or the existing test unit; and
a controller, coupled to the switch matrix and the one or more ASTEs, for determining connections made by said switch matrix;
wherein said first ASTE transmits said first test signals to the first device under test and receives a first response based upon said first test signals from the first device under test when the first switch couples the first ASTE to the first device under test.
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Abstract
An Application Specific Distributed Test Engine (ASDTE) that provides an optimized set of test resources for a given application. The test engine resources, configuration, functionality, and even the number of test engines can be changed as different devices are tested, or as different test methodologies are used with the system. This can be done by including the test engine configuration as a part of the application files that are loaded during the system set-up. This approach differs from conventional testing systems which limit testing to a fixed, limited, or standard stimulus/response engine configuration intended to test a variety of devices. Some of the benefits of the Application Specific Distributed Test Engine Architecture include: (1) a very high test throughput, (2) the ability to adapt system functionality and capabilities to meet different and new, unforeseen device test requirements on a lot-by-lot basis on a production test floor, and (3) the ability to change the number of test engines to optimize tester channels and system utilization.
30 Citations
25 Claims
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1. A distributed test system for testing one or more devices under test including a first device under test, wherein said devices under test include integrated circuits, the distributed test system comprising:
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a first application specific test engine (ASTE) that generates first test signals for the first device under test, wherein the first ASTE is programmable in the testing environment to enable modification of said first test signals based upon a type of said first device under test; an existing test unit to generate a defined set of defined test signals; and a switch matrix including a first switch for connecting the first device under test to one of the first ASTE or the existing test unit; and a controller, coupled to the switch matrix and the one or more ASTEs, for determining connections made by said switch matrix; wherein said first ASTE transmits said first test signals to the first device under test and receives a first response based upon said first test signals from the first device under test when the first switch couples the first ASTE to the first device under test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A distributed test system for testing one or more devices under test including a first device under test, wherein said devices under test include integrated circuits, the distributed test system comprising:
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a first application specific test engine (ASTE) that generates first test signals for the first device under test, wherein the first ASTE is programmable in the testing environment to enable modification of said first test signals based upon a type of said first device under test; and wherein said first ASTE transmits said first test signals to the first device under test and receives a first response based upon said first test signals from the first device under test when the first switch couples the first ASTE to the first device under test. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21)
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22. A method for testing one or more devices under test, including a first device under test, wherein the devices under test comprise integrated circuits, the method comprising:
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loading defined test program into an existing test unit; loading configuration files, including a programmable test program into a first testing unit in the testing environment based upon a type of the device under test; coupling the first device under test to one of said existing test unit or said first testing unit based upon a type of testing; generating first test signals from said first testing unit; transmitting said first test signals to the first device under test; receiving a first response based upon said first test signals from the first device under test when the first switch couples the first testing unit to the first device under test; and identifying errors in said first response representing one or more errors in the first device under test. - View Dependent Claims (23, 24, 25)
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Specification