Systems, Devices, and Methods for Temperature Compensation in Arc Fault Detection Systems

• US 20070247767A1
• Filed: 04/19/2006
• Published: 10/25/2007
• Est. Priority Date: 04/19/2006
• Status: Active Grant

• Current Assignee: Siemens Industry Incorporated (Siemens AG)
• Original Assignee: Siemens Energy & Automation Incorporated (Siemens AG)
• Inventors: Zhang, Bin
• Granted Patent: US 7,499,250 B2
• Time in Patent Office: Days
• US Class Current: 361/42
• CPC Class Codes: H02H 1/0015 Using arc detectors
• CPC Class Codes: H02H 3/006 Calibration or setting of parameters

Abstract

Certain exemplary embodiments comprise a method, which can comprise configuring a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values. The method can comprise configuring the system to modify the plurality of pre-stored threshold values based upon a predetermined change in measured temperature.

Claims

1. A method comprising:

configuring a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system; and

configuring said system to modify said plurality of pre-stored threshold values based upon a predetermined change in measured temperature, said system adapted to sample said measured temperature at a lower rate than a sampling rate of said electrical measurement.

2. The method of claim 1, further comprising:

configuring said system to select said selected pre-stored threshold value from said plurality of pre-stored threshold values based upon said measurement provided by said sensor and said measured temperature.

3. The method of claim 1, further comprising:

configuring said system to obtain said measurement provided by said sensor via a resistive sensor.

4. The method of claim 1, further comprising:

configuring said system to obtain said measurement provided by said sensor via a current transformer.

5. The method of claim 1, further comprising:

configuring said system to obtain said measurement provided by said sensor via a Rogowski coil.

6. The method of claim 1, further comprising:

configuring said system to obtain said measured temperature via an on-chip temperature sensor.

7. The method of claim 1, further comprising:

configuring said system to convert said measured temperature from an analog signal to a digital signal.

8. The method of claim 1, further comprising:

configuring said system to sample a waveform to determine said electrical value.

9. The method of claim 1, further comprising:

configuring said system to send said electrical value to an information device.

10. The method of claim 1, further comprising:

configuring said system to determine said plurality of pre-stored threshold values.

11. The method of claim 1, further comprising:

configuring said system to determine said plurality of pre-stored threshold values after a delay time to allow for self-heating of said sensor.

12. The method of claim 1, further comprising:

configuring said system to determine said plurality of pre-stored threshold values responsive to a sensed temperature, said sensed temperature processed via a method comprising an analog to digital conversion.

13. The method of claim 1, further comprising:

configuring said system to determine said plurality of pre-stored threshold values responsive to a sensed temperature processed via a method comprising an analog to digital conversion performed via an information device.

14. The method of claim 1, further comprising:

configuring said system to sample said temperature measurement at said lower rate based upon a microprocessor pin voltage.

15. The method of claim 1, further comprising:

configuring said system to select said plurality of pre-stored threshold values based upon said measured temperature, wherein said plurality of pre-stored threshold values is a first plurality of pre-stored threshold values, said system adapted to store a second plurality of pre-stored threshold values selectable by said system.

16. A system comprising:

an information device configured to automatically compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system, said information device configured to modify said plurality of pre-stored threshold values based upon a predetermined change in measured temperature, said measured temperature sampled at a lower rate than a sampling rate of said electrical measurement.

17. The system of claim 16, further comprising:

a memory device configured to store said plurality of pre-stored threshold values, said information device communicatively coupled to said memory device.

18. The system of claim 16, further comprising:

said sensor.

19. A machine readable medium comprising instructions for:

configuring a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system; and

configuring said system to modify said plurality of pre-stored threshold values based upon a predetermined change in measured temperature, said system adapted to sample said measured temperature at a lower rate than a sampling rate of said electrical measurement.

20. A method comprising:

providing an electromagnetic signal adapted to configure a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system; and

providing an electromagnetic signal adapted to configure said system to modify said plurality of pre-stored threshold values based upon a predetermined change in measured temperature, said system adapted to sample said measured temperature at a lower rate than a sampling rate of said electrical measurement.

21. A signal embodied in an electromagnetic wave, said signal adapted to cause an information device to:

provide a first set of machine-readable instructions adapted to configure a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system; and

provide a second set of machine-readable instructions adapted to configure said system to modify said plurality of pre-stored threshold values based upon a predetermined change in measured temperature, said system adapted to sample said measured temperature at a lower rate than a sampling rate of said electrical measurement.