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METHOD AND APPARATUS FOR ON-CHIP DUTY CYCLE MEASUREMENT

  • US 20070255517A1
  • Filed: 05/01/2006
  • Published: 11/01/2007
  • Est. Priority Date: 05/01/2006
  • Status: Active Grant
First Claim
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1. A method of calibrating a duty cycle measurement (DCM) circuit for determining the duty cycle of a digital signal, the method comprising:

  • supplying the digital signal to the duty cycle measurement (DCM) circuit, the DCM circuit being situated on an integrated circuit (IC) that includes a capacitor;

    charging, by charger circuitry in the DCM circuit, the capacitor to a voltage value that depends on the duty cycle of the digital signal;

    varying the duty cycle of the digital signal to a plurality of different duty cycle values, the digital signal charging the capacitor to a different voltage value for each of the duty cycle values thereof; and

    storing, in a data store, each voltage value and the corresponding duty cycle value.

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