SYSTEM AND METHODS FOR X-RAY BACKSCATTER REVERSE ENGINEERING OF STRUCTURES
First Claim
1. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system comprising:
- a mobile base portion;
at least a first arm secured to the base at an articulation point;
at least one x-ray source; and
at least one x-ray detector configured to collect x-rays backscattered from the object;
wherein the x-ray detector is positioned on the arm at a location spaced from the articulation point, and the detector is moveable with the arm about the articulation point.
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Accused Products
Abstract
A system and methods for x-ray backscatter reverse engineering of structures. One embodiment includes a plurality of articulated arms attached to a movable base. Another embodiment includes a single counterweighted arm attached to a movable base. The arms include x-ray detectors. At least one x-ray source, which may be mounted on the arm(s), emits x-rays, which are backscattered off the surfaces and objects of interest and captured by the detectors to generate images of hidden objects. The present system provides improved speed and resolution over prior art systems. The system has a field-of-view and effective scanning range versatile enough to work in various orientations and in environments of various sizes. In certain embodiments the system is compact and lightweight so that it can be easily transported and used within confined spaces or in environments where weight is a consideration, such as inside or underneath aircraft. The system is also pointable and adaptable.
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Citations
17 Claims
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1. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system comprising:
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a mobile base portion; at least a first arm secured to the base at an articulation point; at least one x-ray source; and at least one x-ray detector configured to collect x-rays backscattered from the object; wherein the x-ray detector is positioned on the arm at a location spaced from the articulation point, and the detector is moveable with the arm about the articulation point. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system comprising:
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at least one x-ray source; at least one x-ray detector configured to collect x-rays backscattered from the object; and means for generating the image from the backscattered x-rays; wherein the detector is further configured to move relative to the surface while remaining at a substantially constant distance from the surface as it moves, and the detector is further configured to adapt to curves, contours and features on the surface as it moves in order to maintain the substantially constant distance.
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17. A method of using an x-ray backscatter system to interrogate at least one surface and to generate an image of an object obscured behind the surface, the method comprising the steps of:
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collecting a portion of the x-rays that are backscattered from the object using at least one x-ray detector; moving the detector relative to the surface; and generating the image from the backscattered x-rays; wherein the detector remains at a substantially constant distance from the surface as it moves, and the detector adapts to curves, contours and features on the surface as it moves in order to maintain the substantially constant distance.
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Specification