SYSTEM AND METHODS FOR X-RAY BACKSCATTER REVERSE ENGINEERING OF STRUCTURES

• US 20070269006A1
• Filed: 04/25/2007
• Published: 11/22/2007
• Est. Priority Date: 05/04/2006
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Georgeson, Gary E., Safai, Morteza, Edwards, William T.
• Granted Patent: US 7,508,910 B2
• Time in Patent Office: Days
• US Class Current: 378/57
• CPC Class Codes: B64F 5/60 Testing or inspecting aircraft components or systems
• CPC Class Codes: G01N 23/203 Measuring back scattering

Abstract

A system and methods for x-ray backscatter reverse engineering of structures. One embodiment includes a plurality of articulated arms attached to a movable base. Another embodiment includes a single counterweighted arm attached to a movable base. The arms include x-ray detectors. At least one x-ray source, which may be mounted on the arm(s), emits x-rays, which are backscattered off the surfaces and objects of interest and captured by the detectors to generate images of hidden objects. The present system provides improved speed and resolution over prior art systems. The system has a field-of-view and effective scanning range versatile enough to work in various orientations and in environments of various sizes. In certain embodiments the system is compact and lightweight so that it can be easily transported and used within confined spaces or in environments where weight is a consideration, such as inside or underneath aircraft. The system is also pointable and adaptable.

Claims

1. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system comprising:

a mobile base portion;

at least a first arm secured to the base at an articulation point;

at least one x-ray source; and

at least one x-ray detector configured to collect x-rays backscattered from the object;

wherein the x-ray detector is positioned on the arm at a location spaced from the articulation point, and the detector is moveable with the arm about the articulation point.

2. The x-ray backscatter system of claim 1, further comprising at least a second arm secured to the base at a second articulation point.

3. The x-ray backscatter system of claim 2, wherein the first and second arms are each articulable with respect to the base, and are each articulable independently of one another.

4. The x-ray backscatter system of claim 1, wherein the arm has at least one degree of rotational freedom with respect to the base.

5. The x-ray backscatter system of claim 1, wherein the arm has at least two degrees of rotational freedom with respect to the base.

6. The x-ray backscatter system of claim 1, wherein the arm is linearly extensible and contractible.

7. The x-ray backscatter system of claim 1, wherein the arm further comprises:

a first segment;

a second segment; and

a joint connecting the first and second segments.

8. The x-ray backscatter system of claim 7, wherein the joint has at least one degree of freedom.

9. The x-ray backscatter system of claim 7, wherein the joint has at least two degrees of freedom.

10. The x-ray backscatter system of claim 1, wherein the x-ray source is located on the base.

11. The x-ray backscatter system of claim 1, wherein the base includes wheels.

12. The x-ray backscatter system of claim 11, further comprising a track configured to engage the wheels on the base to facilitate rolling movement of the base along a desired path.

13. The x-ray backscatter system of claim 1, wherein the arm includes a counterweight at a location spaced from the detector and on an opposite side of the articulation point from the detector.

14. The x-ray backscatter system of claim 1, wherein the x-ray source is positioned on the arm at a location spaced from the articulation point, and the source is moveable with the arm about the articulation point.

15. The x-ray backscatter system of claim 1, further comprising a visual camera configured to capture an image of the surface.

16. An x-ray backscatter system configured to interrogate at least one surface and to generate an image of an object obscured behind the surface, the system comprising:

at least one x-ray source;

at least one x-ray detector configured to collect x-rays backscattered from the object; and

means for generating the image from the backscattered x-rays;

wherein the detector is further configured to move relative to the surface while remaining at a substantially constant distance from the surface as it moves, and the detector is further configured to adapt to curves, contours and features on the surface as it moves in order to maintain the substantially constant distance.

17. A method of using an x-ray backscatter system to interrogate at least one surface and to generate an image of an object obscured behind the surface, the method comprising the steps of:

collecting a portion of the x-rays that are backscattered from the object using at least one x-ray detector;

moving the detector relative to the surface; and

generating the image from the backscattered x-rays;

wherein the detector remains at a substantially constant distance from the surface as it moves, and the detector adapts to curves, contours and features on the surface as it moves in order to maintain the substantially constant distance.