Remote Test Facility With Wireless Interface To Local Test Facilities

• US 20070271071A1
• Filed: 08/07/2007
• Published: 11/22/2007
• Est. Priority Date: 12/21/2004
• Status: Active Grant

• Current Assignee: FormFactor Incorporated
• Original Assignee: FormFactor Incorporated
• Inventors: Eldridge, Benjamin, Khandros, Igor
• Granted Patent: US 7,613,591 B2
• Time in Patent Office: Days
• US Class Current: 702/188
• CPC Class Codes: G01R 31/2884 using dedicated test connectors, test elements or test circuits on the IC under test G01R31/2855 takes precedence
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Abstract

A central test facility transmits wirelessly test data to a local test facility, which tests electronic devices using the test data. The local test facility transmits wirelessly response data generated by the electronic devices back to the central test facility, which analyzes the response data to determine which electronic devices passed the testing. The central test facility may provide the results of the testing to other entities, such as a design facility where the electronic devices were designed or a manufacturing facility where the electronic devices where manufactured. The central test facility may accept requests for test resources from any of a number of local test facilities, schedule test times corresponding to each test request, and at a scheduled test time, wirelessly transmits test data to a corresponding local test facility.

Claims

1. A method for controlling testing of devices, said method comprising:

wirelessly transmitting test data to a local test facility, said test data for testing ones of said devices;

wirelessly receiving results of testing said ones of said devices; and

wirelessly transmitting test information regarding said results of said testing to at least one of a design facility where said devices are designed or a manufacturing facility where said devices are manufactured.

2-20. -20. (canceled)