Process For Producing A High-Frequency Equivalent Circuit Diagram For Electronic Components

• US 20070276642A1
• Filed: 04/29/2005
• Published: 11/29/2007
• Est. Priority Date: 04/30/2004
• Status: Abandoned Application

• Current Assignee: ams AG (Ams-Osram AG)
• Original Assignee: ams AG (Ams-Osram AG)
• Inventors: Huszka, Zoltan
• Application Number:
  US11/579,216
• Publication Number:
  US 20070276642A1
• Time in Patent Office: Days
• US Class Current: 703/14
• CPC Class Codes: G06F 30/20 Design optimisation, verification or simulation optimisation, verification or simulation of circuit designs G06F30/30
• CPC Class Codes: G06F 30/367 Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Abstract

A method for providing a high-frequency equivalent circuit for an electronic component includes performing a high-frequency measurement on the electronic component, where the electronic component is modeled as a two-port circuit network, obtaining impedance (Z) parameters or admittance (Y) parameters of the electronic component based on the high-frequency measurement, determining branch impedances of a T-equivalent circuit or a Pi-equivalent circuit that corresponds to the electronic component, where determining branch impedances is performed with reference to the Z parameters or the Y parameters, determining coefficients of fractional rational functions for use in describing the branch impedances, determining equivalent circuits as a function of the fractional rational functions, where the equivalent circuits correspond to the branch impedances, and assembling the equivalent circuits to produce a high-frequency equivalent circuit of corresponding to the electronic component.

Claims

1-19. -19. (canceled)

20. A method for providing a high-frequency equivalent circuit for an electronic component, comprising:

performing a high-frequency measurement on the electronic component, the electronic component being modeled as a two-port circuit network;

obtaining impedance (Z) parameters or admittance (Y) parameters of the electronic component based on the high-frequency measurements;

determining branch impedances of a T-equivalent circuit or a Pi-equivalent circuit that corresponds to the electronic component, wherein determining branch impedances is performed with reference to the Z parameters or the Y parameters;

determining coefficients of fractional rational functions for use in describing the branch impedances;

determining equivalent circuits as a function of the fractional rational functions, the equivalent circuits corresponding to the branch impedances; and

assembling the equivalent circuits to produce a high-frequency equivalent circuit corresponding to the electronic component.

21. The method of claim 20, further comprising:

determining S parameters of the electronic component as a function of the high-frequency measurement; and

calculating the Z parameters or the Y parameters using the S parameters.

22. The method of claim 20, further comprising:

determining numerator order and denominator order of a function rational function via an error estimate of each allowable numerator and denominator order by estimating error associated with predefined and denominator orders; and

selecting numerator and denominator orders which produce least error.

23. The method of claim 20, wherein the coefficients of the fractional rational functions are determined from a set of real numbers;

and

wherein all coefficients have a same sign.

24. The method of claim 20, further comprising:

determining numerator order and denominator order of a fractional rational function such that the numerator order differs from the denominator order by one, at most.

25. The method of claim, 20 further comprising:

determining coefficients of a fractional rational function such that the fractional rational function has no poles and no zeros in a right half plane.

26. The method of claim 20, further comprising:

determining coefficients of fractional rational such that a positive residue, if present, is allocated to each pole on an imaginary axis.

27. The method of claim 20, further comprising:

determining coefficients of a fractional rational such that a real part of an impedance represented by the fractional rational function is non-negative for all frequencies.

28. The method of claim 20, further comprising:

determining coefficients of a fractional rational function such that poles and zeros of the fractional rational function are either conjugate complex pole pairs or simple real roots.

29. The method of claim 20, further comprising:

determining an equivalent circuit as a function of a fractional rational via successive extraction of poles and/or zeros of the fractional rational function and adding an inductor or capacitor corresponding to each pole and/or zero to the equivalent circuit.

30. The method of claim 21, further comprising:

determining the S parameters using a 2×

2 scattering matrix.

31. The method of claim 20, wherein the high frequency equivalent circuit is for a passive electronic component.

32. The method of claim 20, wherein the high-frequency equivalent circuit is for an integrated circuit.

33. The method of claim 20, wherein the high-frequency equivalent circuit is for an IC package.

34. The method of claim 20, wherein at least part of the method is performed via a calculating unit.

35. The method of claim 20, wherein at least part of the method is performed via a computer programmed to automatically determine the high-frequency equivalent circuit.

36. The method of claim 21, wherein the S parameters are determined by high-frequency measurement performed automatically using a network analyzer.