NOISE CANCELLATION IN FOURIER TRANSFORM SPECTROPHOTOMETRY

• US 20070291255A1
• Filed: 08/27/2007
• Published: 12/20/2007
• Est. Priority Date: 01/13/2005
• Status: Active Grant

• Current Assignee: Curators of the University of Missouri (University of Missouri)
• Original Assignee: Curators of the University of Missouri (University of Missouri)
• Inventors: Xu, Zhi, Larsen, David
• Granted Patent: US 7,903,252 B2
• Time in Patent Office: Days
• US Class Current: 356/73
• CPC Class Codes: G01J 2003/425 Reflectance
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0262 Constructional arrangements for removing stray light
• CPC Class Codes: G01J 3/0286 Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
• CPC Class Codes: G01J 3/0291 Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08
• CPC Class Codes: G01J 3/45 Interferometric spectrometry
• CPC Class Codes: G01N 2021/3137 with selection of wavelengths after the sample
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: G01N 21/31 Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry G01N21/72 takes precedence
• CPC Class Codes: G01N 2201/0227 Sealable enclosure
• CPC Class Codes: G01N 2201/127 Calibration; base line adjustment; drift compensation

Abstract

Increasing signal to noise ratio in optical spectra obtained by spectrophotometers. An interferometer introduces interference effects into a source light beam. A dual beam configuration splits the source beam having the interference effects into a reference beam and a sample beam. The reference beam interacts with a reference substance and is detected by a reference detector. The sample beam interacts with a sample substance and is detected by a sample detector. An optical spectra of the sample is based on the difference between the detected reference beam and the detected sample beam.

Claims

1. A spectrophotometry system comprising:

an interferometer for receiving, from a light source, a source light beam and introducing interference effects thereto;

a sealed housing for receiving, from the interferometer, the source light beam having the interference effects;

an optical system within the housing for splitting the source light beam having the interference effects into a reference beam and a sample beam and for directing the reference beam and the sample beam in separate paths;

a reference compartment within the housing, said reference compartment including a reference for interacting with the reference beam wherein said interacting yields an output reference beam having a direction;

a reference light detector for detecting at least a portion of the output reference beam based on the direction of the output reference beam and generating a reference signal representative of the detected light;

a sample compartment within the housing, said sample compartment including a sample for interacting with the sample beam wherein said interacting yields an output sample beam having a direction;

a sample light detector for detecting at least a portion of the output sample beam based on the direction of the output sample beam and generating a sample signal representative of the detected light;

a detector circuit for producing a reference voltage proportional to the reference signal and a difference voltage proportional to the difference between the reference signal and the sample signal; and

a processor configured to determine a spectrum of the sample based on the difference voltage.

2. The spectrophotometry system of claim 1 wherein the processor is further configured to determine the spectrum of the sample based on the reference voltage.

3. The spectrophotometry system of claim 1 wherein the processor is further configured to determine the spectrum of the sample based on the sample voltage.

4. The spectrophotometry system of claim 1 wherein the reference reflects at least a portion of the reference beam at a particular direction and the output reference beam comprises said reflected portion of the reference beam having said particular direction.

5. The spectrophotometry system of claim 1 the reference transmits at least a portion of the reference beam at a particular direction and the output reference beam comprises said transmitted portion of the reference beam having said particular direction.

6. The spectrophotometry system of claim 1 wherein the sample reflects at least a portion of the sample beam at a particular direction and the output sample beam comprises said reflected portion of the sample beam having said particular direction.

7. The spectrophotometry system of claim 1 the sample transmits at least a portion of the sample beam at a particular direction and the output sample beam comprises said transmitted portion of the sample beam having said particular direction.

8. The spectrophotometry system of claim 1 wherein the detector circuit includes a variable gain component, said variable gain component balancing the reference signal and the sample signal.

9. The spectrophotometry system of claim 1 wherein the detector circuit includes a summing point having feedback to balance the reference signal and the sample signal.

10. The spectrophotometry system of claim 1 wherein the processor configured to determine a spectrum of the sample based on the difference voltage includes the processor being configured to generate an interferogram from the difference voltage and to calculate a Fourier Transform of the interferogram, wherein said spectrum is a function of the Fourier Transform of the interferogram.

11. The spectrophotometry system of claim 1 further comprising:

a first converter for converting the difference voltage at predefined intervals from an analog signal to a digital signal;

a second converter for converting the reference voltage at the predefined intervals from an analog signal to a digital signal; and

a third converter for converting the sample voltage at the predefined intervals from an analog signal to a digital signal.

12. A spectrophotometry device, comprising:

an interferometer for receiving, from a light source, a source light beam and introducing interference effects thereto;

a sealed housing;

a first beam splitter within the housing and in optical communication with the output of the interferometer, said first beam splitter having a transmissive side and a reflective side;

a second beam splitter within the housing and in optical communication with the transmissive side of said first beam splitter;

a third beam splitter within the housing and in optical communication with the reflective side of said first beam splitter;

a reference detecting system within the housing and in optical communication with one of said second and third beam splitters; and

a sample detecting system within the housing and in optical communication with the other of said second and third beam splitters.

13. The spectrophotometry device of claim 12, wherein said reference and said sample detecting systems are in optical communication with a reflective side of said second beam splitter and a transmissive side of said third beam splitter.

14. The spectrophotometry device of claim 12, further comprising light traps formed as part of said hollow portion and disposed to trap light transmitted from the second beam splitter and reflected light from said third beam splitter.

15. The spectrophotometry device of claim 12, further comprising additional light traps to trap reflected light from said reference and sample detecting systems.

16. The spectrophotometry device of claim 12, wherein said reference and said sample detecting systems each comprise:

a prism including an interaction surface;

a detector;

a lens that focuses a beam output from said prism onto said detector; and

a closed interaction volume having an inlet and an outlet for delivering gas or liquid to the interaction surface.

17. The spectrophotometry device of claim 12, wherein said reference and said sample detecting systems each comprise:

a reflective interaction surface;

a detector;

a lens that focuses a beam output from said reflective interaction surface onto said detector; and

a closed interaction volume having an inlet and an outlet for delivering gas or liquid to the reflective interaction surface.

18. The spectrophotometry device of claim 12, wherein said reference and said sample detecting systems each comprise:

a matte interaction surface;

a detector;

a lens or mirror that focuses scattering output from said matte interaction surface onto said detector; and

a closed interaction volume having an inlet and an outlet for delivering gas or liquid to the interaction surface.

19. A method of determining an optical spectrum for a sample substance, said method comprising:

receiving a source beam from an external light source, said source beam comprising light having a plurality of wavelengths;

splitting the source beam into a reference beam and a sample beam;

directing the reference beam into a reference cell having a reference substance therein, said reference substance interacting with the reference beam, said interacting yielding an output reference beam having a direction;

directing the sample beam into a sample cell having the sample substance therein, said sample substance interacting with the sample beam, said interacting yielding an output sample beam having a direction;

detecting at least a portion of the output reference beam and at least a portion of the output sample beam;

generating a reference signal representative of the detected portion of the output reference beam and a sample signal representative of the detected portion of the output sample beam;

generating a reference voltage proportional to the reference signal and a difference voltage proportional to the difference between the reference signal the sample signal; and

determining a spectrum of the sample based on the difference voltage.

20. The method of claim 19 further comprising introducing interference effects into the source beam, and wherein determining a spectrum of the sample based on the difference voltage comprises generating an interferogram from the difference voltage and calculating a Fourier Transform of the interferogram.