Dynamically controlling a temperature profile in a disk drive for a temperature-dependent reliability study

• US 20070291390A1
• Filed: 06/20/2006
• Published: 12/20/2007
• Est. Priority Date: 06/20/2006
• Status: Active Grant

• Current Assignee: Oracle America, Inc. (Oracle Corporation)
• Original Assignee: Oracle America, Inc. (Oracle Corporation)
• Inventors: Gross, Kenny C., Vaidyanathan, Kalyanaraman, Blythe, Roger E.
• Granted Patent: US 7,660,060 B2
• Time in Patent Office: Days
• US Class Current: 360/53
• CPC Class Codes: G11B 19/048 Testing of disk drives, e.g. to detect defects or prevent sudden failure
• CPC Class Codes: G11B 5/455 Arrangements for functional testing of heads; Measuring arrangements for heads
• CPC Class Codes: G11B 5/4555 by using a spin-stand, i.e. a spinning disc or simulator

Abstract

One embodiment of the present invention provides a system that dynamically controls a temperature profile within a disk drive by generating disk drive activity. During operation, the system first receives a desired temperature profile. Next, the system generates a load profile based on the desired temperature profile, wherein the load profile specifies read/write operations on the disk drive. The system then applies the load profile to the disk drive to generate disk drive activity, wherein the disk activity causes the temperature in the disk drive to track the desired temperature profile.

Claims

1. A method for dynamically controlling a temperature profile within a disk drive by generating disk drive activity, comprising:

receiving a desired temperature profile;

generating a load profile based on the desired temperature profile, wherein the load profile specifies read/write operations on the disk drive; and

applying the load profile to the disk drive to generate disk drive activity, wherein the disk activity causes a temperature profile in the disk drive.

2. The method of claim 1, wherein the method is performed in a feedback and control loop to facilitate obtaining the desired temperature profile in the disk drive.

3. The method of claim 2, wherein obtaining the desired temperature profile using the feedback and control loop involves:

measuring the temperature profile and read/write performance from the disk drive;

computing a difference between the temperature profile and the desired temperature profile;

adjusting the load profile based on the difference; and

applying the adjusted load profile to the disk drive.

4. The method of claim 1, wherein the desired temperature profile is cyclical, which facilitates performing an accelerated temperature reliability test on the disk drive.

5. The method of claim 1, wherein the desired temperature profile can include:

a square-wave profile;

a sinusoidal profile;

a sawtooth profile; and

other periodical waveform profiles.

6. The method of claim 1, wherein generating the load profile involves specifying frequency and magnitude of the read/write operations based on amplitude and period of the desired temperature profile.

7. The method of claim 1, wherein applying the load profile to the disk drive involves:

writing/reading the specified data to/from the disk drive; and

verifying that the data read back from the disk drive is the same as the data written onto the disk drive.

8. The method of claim 1, further comprising:

monitoring the disk drive to detect a temperature-dependent disk drive failure; and

if a disk drive failure occurs, recording the precise time when the disk drive failure occurs.

9. The method of claim 3, wherein measuring the temperature profile and the read/write performance from the disk drive involves using a telemetry system.

10. A computer-readable storage medium storing instructions that when executed by a computer cause the computer to perform a method for dynamically controlling a temperature profile within a disk drive by generating disk drive activity, the method comprising:

receiving a desired temperature profile;

generating a load profile based on the desired temperature profile, wherein the load profile specifies read/write operations on the disk drive; and

applying the load profile to the disk drive to generate disk drive activity, wherein the disk activity causes a temperature profile in the disk drive.

11. The computer-readable storage medium of claim 10, wherein the method is performed in a feedback and control loop to facilitate obtaining the desired temperature profile in the disk drive.

12. The computer-readable storage medium of claim 11, wherein obtaining the desired temperature profile using the feedback and control loop involves:

measuring the temperature profile and read/write performance from the disk drive;

computing a difference between the temperature profile and the desired temperature profile;

adjusting the load profile based on the difference; and

applying the adjusted load profile to the disk drive.

13. The computer-readable storage medium of claim 10, wherein the desired temperature profile is cyclical, which facilitates performing an accelerated temperature reliability test on the disk drive.

14. The computer-readable storage medium of claim 10, wherein the desired temperature profile can include:

a square-wave profile;

a sinusoidal profile;

a sawtooth profile; and

other periodical waveform profiles.

15. The computer-readable storage medium of claim 10, wherein generating the load profile involves specifying frequency and magnitude of the read/write operations based on amplitude and period of the desired temperature profile.

16. The computer-readable storage medium of claim 10, wherein applying the load profile to the disk drive involves:

writing/reading the specified data to/from the disk drive; and

verifying that the data read back from the disk drive is the same as the data written onto the disk drive.

17. The computer-readable storage medium of claim 10, wherein the method further comprises:

monitoring the disk drive to detect a temperature-dependent disk drive failure; and

if a disk drive failure occurs, recording the precise time when the disk drive failure occurs.

18. A computer system that dynamically controls a temperature profile within a disk drive by generating disk drive activity, comprising:

a CPU;

a memory;

a receiving mechanism configured to receive a desired temperature profile;

a generating mechanism configured to generate a load profile based on the desired temperature profile, wherein the load profile specifies read/write operations on the disk drive; and

a loading mechanism configured to apply the load profile to the disk drive to generate disk drive activity, wherein the disk activity causes a temperature profile in the disk drive.

19. The computer system of claim 18, further comprising a feedback and control mechanism configured to obtain the desired temperature profile in the disk drive.

20. The computer system of claim 19, wherein the feedback and control mechanism is configured to:

measure the temperature profile and read/write performance from the disk drive;

compute a difference between the temperature profile and the desired temperature profile;

adjust the load profile based on the difference; and

to

apply the adjusted load profile to the disk drive.

21. The computer system of claim 18, further comprising:

a monitoring mechanism configured to monitor the disk drive to detect a temperature dependent disk drive failure; and

a recording mechanism configured to record the precise time if a disk drive failure occurs.