MINI-PROBER FOR TFT-LCD TESTING
First Claim
1. A prober assembly adapted to test a large area substrate, which includes a length and a width, comprising:
- a rectangular frame having a first dimension that is equal to or less than half of the length of the large area substrate and a second dimension that is equal to or greater than the width of the large area substrate; and
a plurality of prober pins extending from a lower surface of the frame and adapted to contact the large area substrate.
1 Assignment
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Accused Products
Abstract
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns of displays and contact points. The prober assembly is also configured to test fractional sections of the large area substrate. The apparatus also includes a test chamber configured to store at least two prober assemblies within an interior volume.
103 Citations
21 Claims
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1. A prober assembly adapted to test a large area substrate, which includes a length and a width, comprising:
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a rectangular frame having a first dimension that is equal to or less than half of the length of the large area substrate and a second dimension that is equal to or greater than the width of the large area substrate; and
a plurality of prober pins extending from a lower surface of the frame and adapted to contact the large area substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A prober assembly adapted to test a large area substrate having an area, comprising:
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a rectangular frame; and
a plurality of contact heads coupled to a length of the frame and adapted to contact the large area substrate, wherein the rectangular frame comprises an area that is equal to or less than half of the area of the large area substrate. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18)
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19. A test system, comprising:
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a testing table sized to receive a rectangular substrate; and
a prober assembly adapted to contact the large area substrate, wherein the prober assembly comprises;
a rectangular frame; and
a plurality of prober pins extending from a lower surface of the frame and adapted to contact the large area substrate, wherein the rectangular frame comprises an area that is equal to or less than half of the area of the large area substrate and is movable by at least two motors along the length of the testing table. - View Dependent Claims (20, 21)
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Specification