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SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS, MEASUREMENT RESULT MANAGEMENT SYSTEM, AND MANAGEMENT SERVER

  • US 20070296440A1
  • Filed: 08/30/2007
  • Published: 12/27/2007
  • Est. Priority Date: 08/27/2003
  • Status: Active Grant
First Claim
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1. A measurement result management system having:

  • a semiconductor integrated circuit apparatus having;

    a main frame circuit that is an object of measurement;

    a measurement circuit arranged on an identical chip to that of said main frame circuit, said main frame circuit measuring a physical amount of said main frame circuit at the time of an actual operation of said main frame circuit; and

    transmission means for transmitting said measurement result of said measurement circuit and identification information for uniquely identifying said main frame circuit; and

    a management server having;

    reception means for receiving said transmitted measurement result and identification information; and

    management means for managing said received measurement result identification information by identification information.

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