High Precision Voltage Source for Electrical Impedance Tomography

• US 20080001608A1
• Filed: 12/30/2005
• Published: 01/03/2008
• Est. Priority Date: 01/05/2005
• Status: Active Grant

• Current Assignee: Rensselaer Polytechnic Institute
• Original Assignee: Rensselaer Polytechnic Institute
• Inventors: Ross, Alexander, Liu, Ning, Saulnier, Gary
• Granted Patent: US 7,701,227 B2
• Time in Patent Office: Days
• US Class Current: 324/601
• CPC Class Codes: A61B 5/0536 Impedance imaging, e.g. by tomography

Abstract

An EIT system includes a plurality of voltage sources for supplying a corresponding plurality of voltages to a corresponding number of other structures, voltage source calibration means for calibrating each voltage source, and switching means for individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition. Calibrating respective voltages and currents for each voltage source compensates for shunt impedance of each voltage source. A method for calibrating the system includes individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition for calibrating all of said voltage sources in the same way.

Claims

1. An apparatus comprising:

a plurality of voltage sources for supplying a corresponding plurality of voltages to a corresponding number of other structures;

voltage source calibration means for calibrating each voltage source; and

switching means for individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition.

2. The apparatus of claim 1, wherein each voltage source has a shunt impedance and includes an ammeter for use in determining an actual current at an output of said voltage source as a function of said shunt impedance.

3. The apparatus of claim 2, wherein each voltage source includes a voltmeter for measuring an actual voltage in said voltage source.

4. The apparatus of claim 1, wherein each voltage source includes a voltmeter for measuring an actual voltage in said voltage source.

5. The apparatus of claim 1, wherein each voltage source includes an operational amplifier having an output and a sense resistor connected to the output of the operational amplifier, each voltage source also including a buffer amplifier having an input connected to the sense resistor for outputting a measured voltage, and an instrumentation amplifier having one input connected to the operational amplifier output and another input connected to the sense resistor for outputting a measured current.

6. The apparatus of claim 5, wherein said calibration means comprises a second buffer amplifier and a second operational amplifier, said switching means including a plurality of switches for selectively connecting an output of each voltage source to only one of the second buffer and second operational amplifiers for calibrating respective voltages and currents for each voltage source to compensate for shunt impedance of each voltage source.

7. The apparatus of claim 5, wherein said switching means comprises at least one reed relay in at least one of said calibration means and said voltage sources.

8. The apparatus of claim 1, wherein the other structures are a plurality of electrodes that are each adapted to be in contact with a surface of a body to be imaged using electrical impedance imaging, the inactive condition being when the electrodes are not connected to the voltage sources or when the electrodes are out of contact with the body.

9. A method for calibrating an apparatus having a plurality of voltage sources for supplying a corresponding plurality of voltages to a corresponding number of other structures, and voltage source calibration means for calibrating each voltage source, the method comprising:

individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition for calibrating all of said voltage sources in the same way.

10. A method according to claim 9, wherein each voltage source includes an operational amplifier having an output and a sense resistor connected to the output of the operational amplifier, each voltage source also including a buffer amplifier having an input connected to the sense resistor for outputting a measured voltage, and an instrumentation amplifier having one input connected to the operational amplifier output and another input connected to the sense resistor for outputting a measured current, the method including determining a gain for the buffer amplifier.

11. A method according to claim 10, including determining a gain for the instrumentation amplifier.

12. A method according to claim 11, including determining a value for the sense resistor.

13. A method according to claim 12, including determining an output shunt impedance for each voltage source.

14. A method according to claim 9, wherein the other structures are a plurality of electrodes that are each adapted to be in contact with a surface of a body to be imaged using electrical impedance imaging, the inactive condition being when the electrodes are not connected to the voltage sources or when the electrodes are out of contact with the body.

15. A method according to claim 14, including determining an actual current delivered to the body by the voltage source.

16. An electrical impedance imaging apparatus comprising:

a plurality of voltage sources with shunt impedances for supplying a corresponding plurality of voltages to a corresponding number of other structures, each voltage source including an operational amplifier having an output and a sense resistor connected to the output of the operational amplifier, a buffer amplifier having an input connected to the sense resistor for outputting a measured voltage, and an instrumentation amplifier having one input connected to the operational amplifier output and another input connected to the sense resistor for outputting a measured current;

voltage source calibration means for calibrating each voltage source; and

switching means for individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition.

17. The electrical impedance imaging apparatus of claim 16, wherein each voltage source has a shunt impedance and includes an ammeter for use in determining an actual current at an output of said voltage source as a function of said shunt impedance.

18. The electrical impedance imaging apparatus of claim 17, wherein each voltage source includes a voltmeter for measuring an actual voltage in said voltage source.

19. The electrical impedance imaging apparatus of claim 16, wherein each voltage source includes a voltmeter for measuring an actual voltage in said voltage source.

20. The electrical impedance imaging apparatus of claim 16, wherein said calibration means comprises a second buffer amplifier and a second operational amplifier, said switching means including a plurality of switches for selectively connecting an output of each voltage source to only one of the second buffer and second operational amplifiers for calibrating respective voltages and currents for each voltage source to compensate for shunt impedance of each voltage source.

21. The electrical impedance imaging apparatus of claim 16, wherein said switching means comprises at least one reed relay in at least one of said calibration means and said voltage sources.

22. The electrical impedance imaging apparatus of claim 16, wherein the other structures are a plurality of electrodes that are each adapted to be in contact with a surface of a body to be imaged using electrical impedance imaging, the inactive condition being when the electrodes are not connected to the voltage sources or when the electrodes are out of contact with the body.