Method and Apparatus for Contact-less Testing of RFID Straps

• US 20080001769A1
• Filed: 06/22/2007
• Published: 01/03/2008
• Est. Priority Date: 12/22/2004
• Status: Abandoned Application

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments Deutschland Gesellschaft Mit Beschrã¤Nkter Haftung (Texas Instruments, Inc.)
• Inventors: Tan, Enn, Mayer-Zintel, Juergen, Aslanidis, Konstantin
• Application Number:
  US11/766,978
• Publication Number:
  US 20080001769A1
• Time in Patent Office: Days
• US Class Current: 340/653
• CPC Class Codes: G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
• CPC Class Codes: G01R 31/312 by capacitive methods
• CPC Class Codes: G06K 7/0008 General problems related to the reading of electronic memory record carriers, independent of its reading method, e.g. power transfer
• CPC Class Codes: G06K 7/0095 Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly testing of electrical circuits G01R31/28
• CPC Class Codes: G06K 7/10465 the interrogation device being capable of self-diagnosis, e.g. in addition to or as part of the actual interrogation process testing of electrical circuits in general G01R31/28

Abstract

A method and apparatus for batch testing of RFID straps are provided. The RFID straps are arranged on a carrier web in a closely spaced relationship, where each strap includes two terminal pads exposed on the carrier web and an RFID chip. The carrier web is moved so as to align all straps in a batch with corresponding test probes of a test equipment. Each test probe is moved transversely to the moving direction of the carrier web into close proximity with a corresponding strap. A capacitive coupling is established between test electrodes on each test probe and the terminal pads of a corresponding strap. Test signals are then transmitted from each test probe to a corresponding strap, and response signals are received at each test probe from a corresponding strap for evaluation by the test equipment.

Claims

1. A method of batch testing RFID straps arranged on a carrier web in a closely spaced relationship, each RFID strap including at least two terminal pads exposed on the carrier web and an RFID chip with contact bumps each connected to one of the terminal pads, comprising the steps of

moving the carrier web so as to align all RFID straps in a batch with corresponding test probes of a test equipment,

moving each test probe transversely to the moving direction of the carrier web into close proximity with a corresponding RFID strap,

establishing a capacitive coupling between test electrodes on each test probe and the terminal pads of a corresponding RFID strap,

transmitting test signals from each test probe to a corresponding RFID strap, and receiving response signals at each test probe from a corresponding RFID strap.

2. The method of claim 1, wherein the carrier web is indexed to successively present each batch of RFID straps to the test probes of the test equipment.

3. The method of claim 1, wherein the RFID straps in each batch are tested simultaneously.

4. The method of according to claim 1, wherein a strap that has not passed a test is marked.

5. The method of claim 4, wherein the strap is marked by inking.

6. The method of claim 4, wherein the strap is marked by punching.

7. The method of according to claim 1, wherein the test probes are moved with said test electrodes into contact with a face of the carrier web opposite a face on which the straps are attached, the carrier web being used as a dielectric.

8. The method of according to to claim 1, wherein the test probes are moved with said test electrodes against the terminal pads of the straps and a dielectric foil is interposed between each test electrode and each terminal pad.

9. The method of claim 7, wherein residual air between the test electrodes and the terminal pads is removed by aspiration.

10. The method according to to claim 1, wherein the test probes are capacitively and inductively matched with an equivalent circuit represented by each of the RFID straps.

11. Apparatus for batch testing RFID straps arranged on a carrier web in a closely spaced relationship, each RFID strap including a pair of terminal pads exposed on the carrier web and an RFID chip with contact bumps each connected to one of said terminal pads, comprising:

a test head that has a plurality of test probes arranged in an array corresponding to an array of RFID straps in a batch on the carrier web, each test probe having a pair of test electrodes adapted to be aligned with the terminal pads of a corresponding RFID strap;

means for indexing the carrier web so as to successively expose batches of RFID straps to the test head; and

means for moving the test head transversely to the moving direction of the carrier web into close proximity with the RFID straps on the carrier web so as to establish a capacitive coupling between each pair of test electrodes in a test probe and a pair of terminal pads of a corresponding RFID strap.

12. The apparatus of claim 11, wherein the carrier web is made of a dielectric material and the test head is adapted to be moved against a face of the carrier web opposite a face that carries the RFID straps.

13. The apparatus of claim 11, wherein the test head is adapted to be moved against a face of the carrier web that carries the RFID straps, and wherein a dielectric foil is interposed between each pair of test electrodes and a corresponding pair of terminal pads.

14. The apparatus of claim 12, comprising aspirating means for removing residual air between the test head and the carrier web.

15. The apparatus of claim 13, comprising aspirating means for removing residual air between the test head with the dielectric foil and the exposed terminal pads of the tags.

16. The apparatus of claim 11, comprising an inking device for selectively marking an RFID strap that has not passed a test.

17. The apparatus of claim 11, comprising a stamping device for selectively marking an RFID strap that has not passed a test.

18. The apparatus of claim 11, wherein each test probe includes a matching circuit with at least a capacitive element and an inductive element for capacitive and inductive matching with an equivalent circuit represented by each RFID strap.

19. The apparatus of claim 12 wherein each test probe includes a matching circuit with at least a capacitive element and an inductive element for capacitive and inductive matching with an equivalent circuit represented by each RFID strap.

20. The apparatus of claim 13, wherein each test probe includes a matching circuit with at least a capacitive element and an inductive element for capacitive and inductive matching with an equivalent circuit represented by each RFID strap.