SEMICONDUCTOR MEMORY DEVICE IN WHICH DATA IS STORED IN NONVOLATILE STATE, BY USING SEMICONDUCTOR ELEMENTS OF METAL OXIDE SEMICONDUCTOR (MOS) STRUCTURE
First Claim
1. A semiconductor memory device comprising:
- a memory element which includes a semiconductor element of metal oxide semiconductor (MOS) structure in which data is programmed when an insulating film provided in the semiconductor element is broken down by application of a voltage thereto;
a first data line and a second data line which is connected to a sense amplifier;
a first selection transistor which is configured to connect the memory element to the first data line in order to program data in the memory element; and
a second selection transistor which is configured to connect the memory element to the second data line in order to program data in the memory element and detect the data programmed in the memory element and which has a smaller gate-electrode width smaller than the first selection transistor.
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Abstract
A semiconductor memory device includes a memory element, a first data line and a second data line, a first selection transistor, and a second selection transistor. The memory element includes a semiconductor element of MOS structure in which data is programmed when an insulating film provided in the semiconductor element is broken down by application of a voltage thereto. The first and second data lines are connected to a sense amplifier. The first selection transistor is configured to connect the memory element to the first data line in order to program data in the memory element. The second selection transistor is configured to connect the memory element to the second data line in order to program data in the memory element and detect the data programmed in the memory element. The second selection transistor has a smaller gate-electrode width smaller than the first selection transistor.
23 Citations
15 Claims
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1. A semiconductor memory device comprising:
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a memory element which includes a semiconductor element of metal oxide semiconductor (MOS) structure in which data is programmed when an insulating film provided in the semiconductor element is broken down by application of a voltage thereto; a first data line and a second data line which is connected to a sense amplifier; a first selection transistor which is configured to connect the memory element to the first data line in order to program data in the memory element; and a second selection transistor which is configured to connect the memory element to the second data line in order to program data in the memory element and detect the data programmed in the memory element and which has a smaller gate-electrode width smaller than the first selection transistor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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Specification