Temperature control to reduce cascade failures in a multi-device array
First Claim
1. A method comprising severing an operational connection between a host device and a plurality of storage devices of a multi-device array in relation to a detected temperature of at least one storage device of said array.
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Accused Products
Abstract
Method and apparatus for reducing a likelihood of a cascade failure in a multi-device array. The array preferably comprises a controller and a plurality of storage devices to define a memory space across which data are stored in accordance with a selected RAID configuration. The controller operates to sever an operational connection between the storage devices and a host device in relation to a detected temperature of at least one storage device of the array. Preferably, when a selected device reaches a first threshold temperature level, the controller arms for a potential shutdown. When a selected device reaches a second higher threshold temperature, the controller preferably powers down all of the devices and executes a self-reboot operation. The controller preferably monitors a temperature of the array while the devices remain powered down, after which the storage devices are powered up and data reconstruction operations take place as required.
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Citations
20 Claims
- 1. A method comprising severing an operational connection between a host device and a plurality of storage devices of a multi-device array in relation to a detected temperature of at least one storage device of said array.
- 9. An apparatus comprising a multi-device array comprising a controller and a plurality of storage devices, the controller configured to sever an operational connection between the plurality of storage devices and a host device in relation to a detected temperature of at least one said storage device.
- 17. An apparatus comprising a multi-device array comprising a plurality of storage devices and first means for severing an operational connection between the plurality of storage devices and a host device in relation to a detected temperature of at least one said storage device.
Specification