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Qualifying of a detector of noise peaks in the supply of an integrated circuit

  • US 20080012574A1
  • Filed: 06/15/2007
  • Published: 01/17/2008
  • Est. Priority Date: 06/29/2006
  • Status: Active Grant
First Claim
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1. A method for qualifying a parasitic supply peak detector of an integrated circuitry, comprising at least steps of:

  • supply of the integrated circuit to be tested under at least a first voltage;

    checking of a starting of the circuit;

    application of at least one first noise peak on the circuit power supply, while respecting an amplitude and time gauge; and

    comparison of average currents consumed by the circuit before and after the peak.

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