RADIATION-HARDENED PROGRAMMABLE DEVICE
First Claim
1. A method of converting a soft SRAM memory into a radiation hardened read-only memory, the method comprising:
- programming a data pattern into an SRAM memory;
irradiating the SRAM memory at a total dosage of between 300K and 1 Meg RAD in order to burn the data pattern into memory.
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Accused Products
Abstract
A method of programming a radiation-hardened integrated circuit includes the steps of supplying a prototype device including an SRAM memory circuit or programmable key circuit to a customer, having the customer develop working data patterns in the field in the same manner as a reading and writing to a normal RAM memory, having the customer save the final debugged data pattern, delivering the data pattern to the factory, loading the customer-developed data pattern into memory, programming the customer-developed data pattern into a number of production circuits, irradiating the production circuits at a total dosage of between 300K and 1 Meg RAD to burn the data pattern into memory, and shipping the irradiated and programmed parts to the customer.
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Citations
10 Claims
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1. A method of converting a soft SRAM memory into a radiation hardened read-only memory, the method comprising:
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programming a data pattern into an SRAM memory;
irradiating the SRAM memory at a total dosage of between 300K and 1 Meg RAD in order to burn the data pattern into memory. - View Dependent Claims (2)
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3. A method of using a radiation-hardened integrated circuit comprising:
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receiving soft prototype memory devices;
developing a final, debugged, data pattern using the soft prototype memory devices;
shipping the final data pattern to the factory;
receiving irradiated pin-compatible production memory devices including a read-only version of the final data pattern from the factory. - View Dependent Claims (4, 5, 6)
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7. A programmable key method comprising:
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providing a plurality of key circuits;
writing a data pattern into a plurality of key circuits; and
irradiating the key circuits at a total dosage of between 300K and 1 Meg RAD in order to burn the data pattern into memory. - View Dependent Claims (8, 9, 10)
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Specification