Quality Assurance System and Method

• US 20080016119A1
• Filed: 07/16/2007
• Published: 01/17/2008
• Est. Priority Date: 07/14/2006
• Status: Abandoned Application

• Current Assignee: Hewlett Packard Enterprise Development LP (Hewlett-Packard Enterprise Company)
• Original Assignee: Hewlett Packard Enterprise Development LP (Hewlett-Packard Enterprise Company)
• Inventors: Denomme, Michael A., Sharma, Parit K.
• Application Number:
  US11/778,521
• Publication Number:
  US 20080016119A1
• Time in Patent Office: Days
• US Class Current: 707/104.1
• CPC Class Codes: G05B 19/41875 characterised by quality surveillance of production
• CPC Class Codes: G05B 2219/32187 Correlation between controlling parameters for influence on quality parameters
• CPC Class Codes: G05B 2219/32203 Effect of material constituents, components on product manufactured
• CPC Class Codes: Y02P 90/02 Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

Systems, processes, and devices may facilitate quality assurance in a manufacturing process. In certain implementations, systems, processes, and devices for quality assurance may include the ability to receive inspection data regarding an item being manufactured, the item having a number of components, and insert the data into a data organization. The data organization may include a first data structure for capturing identification data regarding the item and the inspections for the item, a second data structure for capturing data regarding defects in the item'"'"'s components, and a third data structure for capturing data regarding the item'"'"'s components. A fourth data structure may be linked to the first, second, and third data structures for capturing data regarding the item, the inspections for the item, the defects for the item'"'"'s components, and the components containing the defects. The data organization may be used to generate responses to queries.

Claims

1. A quality control system for a manufacturing process, the system comprising:

a plurality of inspection stations for receiving data regarding an item that is being manufactured, the item having a plurality of components; and

a data management system coupled to the inspection stations, the data management system comprising;

a data manager operable to generate responses to queries by using a data organization comprising;

a first data structure for capturing identification data regarding the item being manufactured and the inspections for the item;

a second data structure for capturing data regarding defects in the components of the item;

a third data structure for capturing data regarding the components of the item; and

a fourth data structure linked to the first, second, and third data structures for capturing data regarding the item, the inspections for the item, the defects for the components of the item, and the components containing the defects.

2. The system of claim 1, wherein the first data structure is linked to a fifth data structure and a sixth data structure, the fifth data structure for capturing data regarding the item being manufactured and the sixth data structure for capturing data regarding inspection stations for the manufacturing process.

3. The system of claim 2, wherein the sixth data structure is linked to a seventh data structure for capturing data regarding an area of the manufacturing process.

4. The system of claim 2, wherein the data management system is operable to associate a defect in an item with an inspection station.

5. The system of claim 1 wherein the second data structure is linked to an eighth data structure for capturing data regarding potential defects for the components of the item and a ninth data structure for capturing data regarding the inspection stations and components inspected thereby.

6. The system of claim 5, wherein the ninth data structure is linked to a tenth data structure and an eleventh data structure, the tenth data structure for capturing data regarding inspection stations for the manufacturing process and the eleventh data structure for capturing data regarding components of the item.

7. The system of claim 5, wherein the ninth data structure specifies associations between inspection stations and the components of the item.

8. The system of claim 7, wherein a plurality of inspection stations are associated with one component.

9. The system of claim 5, wherein the second data structure specifies associations between potential defects and components of an item.

10. The system of claim 5, wherein the second data structure is linked to a twelfth data structure for capturing data regarding the location of a defect.

11. The system of claim 10, wherein the data management system is operable to associate a defect with a location on an item.

12. The system of claim 5, wherein the second data structure is linked to a thirteenth data structure for capturing standardized defect codes.

13. The system of claim 5, wherein the data management system is able to associate a defect with a component and an inspection station.

14. The system of claim 1, wherein the third data structure is adapted to capture data regarding departments of the manufacturing process associated with components of the item.

15. The system of claim 14, wherein the third data structure is linked to a fourteenth data structure and fifteenth structure, the fourteenth data structure for capturing data regarding a department in the manufacturing process and the fifteenth data structure for capturing data regarding sub-components of components.

16. The system of claim 15, wherein the data management system is operable to associate a defect with a department in the manufacturing process.

17. The system of claim 1, wherein the item comprises an automobile.

18. The system of claim 1, wherein the data organization comprises a relational database and the data structures comprise tables.

19. A method for quality control in a manufacturing process, the method comprising:

receiving inspection data regarding an item that is being manufactured, the item having a plurality of components;

inserting the data into a data organization comprising;

a first data structure for capturing identification data regarding the item being manufactured and the inspections for the item,

a second data structure for capturing data regarding defects in the components of the item,

a third data structure for capturing data regarding the components of the item, and

a fourth data structure linked to the first, second, and third data structures for capturing data regarding the item, the inspections for the item, the defects for the components of the item, and the components containing the defects; and

generating responses to queries by using the data organization.

20. The method of claim 19, wherein the first data structure is linked to a fifth data structure and a sixth data structure, the fifth data structure for capturing data regarding the item being manufactured and the sixth data structure for capturing data regarding inspection stations for the manufacturing process.

21. The method of claim 20, further comprising associating a defect in an item with an inspection station.

22. The method of claim 19, wherein the second data structure is linked to an seventh data structure for capturing data regarding potential defects for the components of the item and an eighth structure for capturing data regarding the inspection stations and components inspected thereby.

23. The method of claim 22, wherein the eighth data structure specifies associations between inspection stations and the components of the item.

24. The method of claim 22, wherein the second data structure specifies associations between potential defects and components of an item.

25. The method of claim 22, wherein the second data structure is linked to a ninth data structure for capturing data regarding the location of a defect.

26. The method of claim 22, further comprising associating a defect with a component and an inspection station.

27. The method of claim 19, wherein the third data structure is adapted to capture data regarding departments of the manufacturing process associated with components of the item.

28. The method of claim 27, further comprising associating a defect with a department in the manufacturing process.

29. A system for quality control in a manufacturing process, the method comprising:

means for receiving inspection data regarding an item that is being manufactured, the item having a plurality of components;

means for inserting the data into a data organization comprising;

a first data structure for capturing identification data regarding the item being manufactured and the inspections for the item,

a second data structure for capturing data regarding defects in the components of the item,

a third data structure for capturing data regarding the components of the item, and

a fourth data structure linked to the first, second, and third data structures for capturing data regarding the item, the inspections for the item, the defects for the components of the item, and the components containing the defects; and

means for generating responses to queries by using the data organization.

30. A quality control system for a manufacturing process, the system comprising:

a plurality of inspection stations for receiving data regarding an item that is being manufactured, the item having a plurality of components; and

a data management system coupled to the inspection stations, the data management system comprising;

a data manager operable to generate responses to queries by using a data organization comprising;

a first data structure for capturing identification data regarding the item being manufactured and the inspections for the item;

a second data structure linked to the first data structure, the second data structure for capturing data regarding the item being manufactured;

a third data structure linked to the first data structure, the third for capturing data regarding inspection stations for the manufacturing process;

a fourth data structure linked to the third data structure for capturing data regarding an area of the manufacturing process;

a fifth data structure for capturing data regarding defects in the components of the item, the fifth data structure specifying associations between potential defects and components of an item;

a sixth data structure linked to the fifth data structure for capturing data regarding potential defects for the components of the item;

a seventh data structure linked to the fifth data structure for capturing data regarding the location of a defect;

an eighth data structure linked to the fifth data structure for capturing data regarding the inspection stations and components inspected thereby, the eighth data structure specifying associations between inspection stations and the components of the item, wherein the third data structure is also linked to the eighth data structure;

a ninth data structure linked to the eighth data structure for capturing data regarding components of the item;

a tenth data structure for capturing data regarding the components of the item and departments of the manufacturing process associated with components of the item;

an eleventh data structure linked to the tenth data structure for capturing data regarding a department in the manufacturing process;

a twelfth data structure linked to the tenth data structure for capturing data regarding sub-components of components, wherein the ninth data structure is linked to the twelfth data structure; and

a thirteenth data structure linked to the first, fifth, and tenth data structures for capturing data regarding the item, the inspections for the item, the defects for the components of the item, and the components containing the defect;

the data management system, using the data organization, operable to;

associate a defect in an item with an inspection station;

associate a defect with a location on an item;

associate a defect with a component and an inspection station; and

associate a defect with a department in the manufacturing process.