WAVELENGTH -TUNABLE SELECTIVE OPTOELECTRONIC FILTER

• US 20080019409A1
• Filed: 07/05/2007
• Published: 01/24/2008
• Est. Priority Date: 01/07/2005
• Status: Abandoned Application

• Current Assignee: Centre National De La Recherche Scientifique
• Original Assignee: Centre National De La Recherche Scientifique
• Inventors: Leclercq, Jean-Louis, Garrigues, Michel
• Application Number:
  US11/773,684
• Publication Number:
  US 20080019409A1
• Time in Patent Office: Days
• US Class Current: 372/45.01
• CPC Class Codes: G01J 3/26 using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
• CPC Class Codes: G02B 26/001 based on interference in an adjustable optical cavity interference filters G02B5/28; devices or arrangements using multiple reflections in spectrometry or monochromators G01J3/26

Abstract

A selective and wavelength-tunable optoelectronic filter comprising a resonant cavity placed between two partial reflectors (10, 12) such as Bragg mirrors, the resonant cavity being formed by a disk (16) of solid material having a high refractive index that constitutes a waveguide between the two partial reflectors (10, 12). The filter presents excellent selectivity.

Claims

1. A wavelength tunable selective optoelectronic filter comprising a resonant cavity formed between two partial reflectors, each constituted by a stack of layers that are transparent at the wavelength used, together with means for applying an electric field to the terminals of the reflectors for the purpose of wavelength tuning the filter, wherein the resonant cavity is constituted by a disk of solid material that is transparent at said wavelength and that has a high refractive index, forming a waveguide between the reflectors, and wherein a first one of the reflectors is movable or deformable at least in part and is separated from the disk forming the resonant cavity by a plate of air.

2. A filter according to claim 1, wherein the second of the reflectors is movable or deformable at least in part and separated from the disk forming the resonant cavity by a plate of air.

3. A filter according to claim 1, wherein the disk of high-index material has a small diameter, for quasi-monomode propagation of the resonant wave.

4. A filter according to claim 1, wherein the first reflector comprises alternating layers of air and layers or plates of solid material that is transparent to said wavelength, and includes a movable or deformable layer of solid material that is separated from the disk by the above-specified plate of air.

5. A filter according to claim 1, wherein the second reflector comprises alternating layers of air and layers or plates of solid material transparent at said wavelengths, one of said layers of solid material forming a movable or deformable plate that is separated from the disk of the resonant cavity by a layer of air.

6. A filter according to claim 4, wherein the layers of solid material in the two reflectors are layers of semiconductor material, and wherein the moving layer of the or each above-mentioned reflector has doping opposite to that of the doping of the other layers of solid material of the reflector.

7. A filter according to claim 6, wherein the doping of both moving layers is of the same type.

8. A filter according to claim 4, wherein the or each moving layer is a suspended layer.

9. A filter according to claim 4, wherein the layer of air separating the disk forming the resonant cavity from a moving layer has a thickness equal to (2 k+1)2/4.

10. A filter according to claim 1, wherein the disk forming the resonant cavity has a thickness equal to k.A/2.

11. A filter according to claim 1 wherein the disk forming the resonant cavity is of circular outline.

12. A filter according to claim 1, all of the layers of solid material of the two partial reflectors, and the disk forming the resonant cavity, are suspended, and wherein the filter is made by ionic etching and by selective chemical etching.

13. A filter according to claim 4, wherein the wavelength tuning means comprise electrodes connected to layers of semiconductor material situated on opposite sides of the disk and said moving layer, together with means for applying a control voltage to said electrodes.

14. A filter according to claim 5, wherein the wavelength tuning means comprise a first electrode connected to a stationary layer of semiconductor material of one of the reflectors, an electrode connected to the disk forming the resonant cavity, and a third electrode connected to a stationary layer of semiconductor material of the other reflector, together with means for applying identical voltages between the second and third electrodes, and between the second and third electrodes.