Method and Apparatus for Automatic Application and Monitoring of a Structure to be Applied Onto a Substrate
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Accused Products
Abstract
A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.
60 Citations
72 Claims
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1-30. -30. (canceled)
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31. Method for automatic application and monitoring of a structure to be applied onto a substrate, comprising:
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determining a reference contour of a component located between two elements that are to be connected by utilizing a first camera in a leading direction to record a plurality of images; regulating the progression of the structure to be applied according to the reference contour; guiding an application facility based on the images recorded by the first camera; applying the structure onto the substrate by the application facility according to the reference contour determined by the first camera; monitoring the structure applied onto the substrate by the application facility utilizing a second camera in trailing direction; and characterizing the reference contour by performing a three-dimensional positional correction for the application facility by means of the stereometry procedure utilizing the two cameras. - View Dependent Claims (32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55)
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56. An apparatus for automatic application and monitoring of a structure to be applied onto a substrate, comprising:
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at least one illumination module; and a sensor unit having at least two cameras provided around an application facility for the structure to be applied, a first camera configured in a leading direction for regulation of the application facility by means of a reference contour and a second camera configured in a trailing direction for simultaneous online monitoring of the structure applied onto the substrate. - View Dependent Claims (57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 72)
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Specification