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METHOD AND APPARATUS FOR GENERATING TEMPERATURE-COMPENSATED READ AND VERIFY OPERATIONS IN FLASH MEMORIES

  • US 20080025121A1
  • Filed: 10/02/2007
  • Published: 01/31/2008
  • Est. Priority Date: 08/26/2005
  • Status: Active Grant
First Claim
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1. A circuit for generating at least one word-line signal, comprising:

  • a first current source operably coupled to a current sum node and configured for generating a first current wherein an amount of the first current is substantially correlated to a temperature dependant threshold voltage of at least one storage cell; and

    a voltage converter operably coupled to the current sum node and configured for generating at least one word-line signal having a word-line voltage proportional to the first current.

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