ANALYSIS SYSTEM AND METHOD FOR ANALYZING A SAMPLE ON AN ANALYTICAL TEST ELEMENT
First Claim
1. Analysis system for analyzing a sample on an analytical test element, comprising a test element receptacle configured for receiving and positioning the test element in an analysis position, the test element receptacle comprising a guide part and a lock part, the guide part being configured to guide the test element into and out of the analysis position, the lock part comprising a frame and a bolt element, the frame and bolt element being connected to one another by a hinge, the bolt element being pivotable about the hinge in order to move between a first position and a second position relative to the frame, the bolt element comprising a latching lug for engaging a recess provided in the test element when the test element is positioned in the analysis position and when the bolt element is in the first position.
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Accused Products
Abstract
The invention relates to embodiments of an analysis system and to a method for analyzing a sample on an analytical test element, with the analysis system comprising a test element receptacle for receiving and positioning a test element in an analysis position. In an exemplary embodiment, the test element receptacle contains a guide part and a lock part, the guide part having means for guiding a test element into and out of the analysis position, the lock part comprising a frame and a bolt element, which frame and bolt element are connected to one another by a hinge. The bolt element can be pivoted about the hinge between a first position and a second position with respect to the frame. The bolt element comprises a latching lug for engaging in a recess in test element when the bolt element is in the first position and when the test element is positioned in the analysis position.
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Citations
15 Claims
- 1. Analysis system for analyzing a sample on an analytical test element, comprising a test element receptacle configured for receiving and positioning the test element in an analysis position, the test element receptacle comprising a guide part and a lock part, the guide part being configured to guide the test element into and out of the analysis position, the lock part comprising a frame and a bolt element, the frame and bolt element being connected to one another by a hinge, the bolt element being pivotable about the hinge in order to move between a first position and a second position relative to the frame, the bolt element comprising a latching lug for engaging a recess provided in the test element when the test element is positioned in the analysis position and when the bolt element is in the first position.
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12. Method for analysis of a sample on an analytical test element in an analysis system, comprising the steps of:
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receiving a test element in a test element receptacle of the analysis system, the test element being guided into an analysis position by means for guiding the test element in a guide part to the test element receptacle, the test element being locked in the analysis position by a lock part of the test element receptacle, the lock part having a frame and a bolt element which are connected to one another by means of a hinge, the bolt element pivoting about the hinge between a second position and a first position in which a latching lug of the bolt element engages in a recess in the test element which is positioned in the analysis position, and analyzing the sample in a test field of the test element using a measurement technique of the analysis system. - View Dependent Claims (13, 14)
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Specification