Model network of a nonlinear circuitry

• US 20080057882A1
• Filed: 08/30/2006
• Published: 03/06/2008
• Est. Priority Date: 08/30/2006
• Status: Active Grant

• Current Assignee: Infineon Technologies AG
• Original Assignee: Infineon Technologies AG
• Inventors: Singerl, Peter, Kubin, Gernot
• Granted Patent: US 7,561,857 B2
• Time in Patent Office: Days
• US Class Current: 455/115.1
• CPC Class Codes: H03F 1/3258 based on polynomial terms

Abstract

A model network of a nonlinear circuitry includes one or more static nonlinear elements and a plurality of linear filters with transfer functions. A method for determining the model network includes performing an input amplitude-to-output amplitude measurement of the nonlinear circuitry and performing an input amplitude-to-output phase measurement of the nonlinear circuitry. The transfer functions are calculated on the basis of results of the input amplitude-to-output amplitude measurement and input amplitude-to-output phase measurement.

Claims

1. A method for determining a model network of nonlinear circuitry having an input and an output, the model network comprising one or more static nonlinear elements and a plurality of linear filters with transfer functions, comprising:

performing an input amplitude-to-output amplitude measurement of the nonlinear circuitry,

performing an input amplitude-to-output phase measurement of the nonlinear circuitry, and

calculating the transfer functions of the linear filters on the basis of results of the input amplitude-to-output amplitude measurement and input amplitude-to-output phase measurement.

2. The method of claim 1, wherein the input amplitude-to-output phase (AM/PM) measurement comprises:

coupling a test signal into the input of the nonlinear circuitry;

sweeping a frequency and an amplitude of the test signal; and

measuring a phase of a signal at the output of the nonlinear circuitry over the swept frequency and swept amplitude test signal.

3. The method of claim 2, wherein the test signal comprises two tones of different frequencies, and the frequency for sweeping is the difference between the different frequencies of the two tones.

4. The method of claim 3, wherein the test signal has exactly two tones of different frequencies.

5. The method of claim 1, wherein the input amplitude-to-output amplitude measurement comprises:

coupling a test signal into the input of the nonlinear circuitry;

sweeping a frequency and an amplitude of the test signal; and

measuring an amplitude of a signal at the output of the nonlinear circuitry over the swept frequency and swept amplitude test signal.

6. The method of claim 1, further comprising using a two-tone network analyzer for performing the measurements.

7. The method of claim 1, wherein performing the input amplitude-to-output amplitude measurement and the input amplitude-to-output phase measurement of the nonlinear circuitry provides a set of measurement result vectors, and wherein complex value elements of each measurement result vector represent the magnitude and phase of the output signal for different input signal amplitudes at a given input signal frequency.

8. The method of claim 7, wherein calculating the transfer functions comprises calculating transfer function values of the filters on the basis of the set of measurement result vectors.

9. The method of claim 1, wherein the model network comprises a baseband model network of the nonlinear circuitry using memory polynomials.

10. The method of claim 1, wherein the nonlinear circuitry comprises a power amplifier.

11. A method for configuring a predistorter adapted to linearize nonlinear circuitry having an input and an output, the predistorter comprising one or more static nonlinear elements and a plurality of linear filters with transfer functions, comprising:

performing an input amplitude-to-output amplitude measurement of the nonlinear circuitry,

performing an input amplitude-to-output phase measurement of the nonlinear circuitry, and

calculating the transfer functions of the linear filters of the predistorter on the basis of results of the input amplitude-to-output amplitude measurement and input amplitude-to-output phase measurement.

12. The method of claim 11, wherein the input amplitude-to-output phase measurement comprises:

coupling a test signal into the input of the nonlinear circuitry;

sweeping a frequency and an amplitude of the test signal; and

measuring a phase of a signal at the output of the nonlinear circuitry over the swept frequency and swept amplitude test signal.

13. The method of claim 12, wherein the test signal comprises two tones of different frequencies, and the frequency for sweeping is the difference between the different frequencies of the two tones.

14. The method of claim 13, wherein the test signal has exactly two tones of different frequencies.

15. The method of claim 11, wherein the input amplitude-to-output amplitude measurement comprises:

coupling a test signal into the input of the nonlinear circuitry;

sweeping a frequency and an amplitude of the test signal; and

measuring an amplitude of a signal at the output of the nonlinear circuitry over the swept frequency and swept amplitude test signal.

16. The method of claim 11, further comprising using a two-tone network analyzer for performing the measurements.

17. The method of claim 11, wherein performing the input amplitude-to-output amplitude measurement and the input amplitude-to-output phase measurement of the nonlinear circuitry provides a set of measurement result vectors, and wherein complex value elements of each measurement result vector represent the magnitude and phase of the output signal for different input signal amplitudes at a given input signal frequency.

18. The method of claim 17, wherein calculating the transfer functions comprises calculating transfer function values of the filters on the basis of the set of measurement result vectors.

19. The method of claim 11, wherein the predistorter comprises a baseband predistorter, and wherein the static nonlinear elements and linear filters thereof are configured to represent memory polynomials.

20. A circuit for analyzing nonlinear circuitry having an input and an output, the nonlinear circuitry being modeled by a model network comprising one or more static nonlinear elements and a plurality of linear filters with transfer functions, comprising:

a test signal generator coupled to the input of the nonlinear circuitry;

a measurement unit coupled to the output of the nonlinear circuitry and configured to perform an input amplitude-to-output amplitude measurement and an input amplitude-to-output phase measurement of the nonlinear circuitry; and

a calculation unit operably coupled to the measurement unit and adapted to calculate the transfer functions on the basis of results of the input amplitude-to-output amplitude measurement and input amplitude-to-output phase measurement.

21. The circuit of claim 20, wherein the test signal generator is adapted to couple a test signal into the input of the nonlinear circuitry and sweep a frequency and an amplitude of the test signal.

22. The circuit of claim 21, wherein the test signal comprises two tones of different frequencies, and the frequency for sweeping is the difference between the different frequencies of the two tones.

23. The circuit of claim 22, wherein the test signal has exactly two tones of different frequencies.

24. The circuit of claim 20, wherein the measurement unit is further configured to record a set of measurement result vectors, wherein complex value elements of each measurement result vector represent magnitude and phase of the output signal for different input signal amplitudes at a given input signal frequency.

25. The circuit of claim 24, wherein the calculation unit is adapted to calculate the transfer functions of the filters on the basis of the set of measurement result vectors.

26. A circuit for determining a configuration of a predistorter to linearize a nonlinear circuitry having an input and an output, the predistorter comprising one or more static nonlinear elements and a plurality of linear filters with transfer functions, comprising:

a test signal generator coupled to the input of the nonlinear circuitry;

a measurement unit coupled to the output of the nonlinear circuitry and configured to perform an input amplitude-to-output amplitude measurement and an input amplitude-to-output phase measurement of the nonlinear circuitry; and

a calculation unit operably coupled to the measurement unit and adapted to calculate the transfer functions on the basis of results of the input amplitude-to-output amplitude measurement and input amplitude-to-output phase measurement.

27. The circuit of claim 26, wherein the test signal generator is adapted to couple a test signal into the input of the nonlinear circuitry and sweep a frequency and an amplitude of the test signal.

28. The circuit of claim 27, wherein the test signal comprises two tones of different frequencies, and the frequency for sweeping is the difference between the different frequencies of the two tones.

29. The circuit of claim 28, wherein the test signal has exactly two tones of different frequencies.

30. The circuit of claim 26, wherein the measurement unit is further configured to record a set of measurement result vectors, wherein complex value elements of each measurement result vector represent the magnitude and phase of the output signal for different input signal amplitudes at a given input signal frequency.

31. The circuit of claim 30, wherein the calculation unit is adapted to calculate the transfer functions of the filters on the basis of the set of measurement result vectors.

32. The circuit of claim 31, wherein the calculation unit is adapted to calculate transfer functions from the frequency responses of the filters.

33. The circuit of claim 26, wherein the predistorter comprises a baseband predistorter, and wherein the static nonlinear elements and linear filters thereof are configured to represent memory polynomials.