Apparatus And Method For Performing Failure Diagnostic Testing of Electronic Equipment

• US 20080059838A1
• Filed: 11/21/2006
• Published: 03/06/2008
• Est. Priority Date: 09/01/2006
• Status: Abandoned Application

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Murray, David W., Thanh, Kim Chung Thi, Dematteis, James M., Melman, Phillipe A.
• Application Number:
  US11/562,400
• Publication Number:
  US 20080059838A1
• Time in Patent Office: Days
• US Class Current: 714/25
• CPC Class Codes: G01R 31/318314 Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages simulation software G01R31/318357; emulators G06F11/261
• CPC Class Codes: G01R 31/318357 Simulation computer simulation of digital circuits G06F30/3308
• CPC Class Codes: G01R 31/31912 Tester/user interface

Abstract

An apparatus and method for automated diagnostic testing of an electronic device assembly so that functional testing, collection of test results, diagnosis for identifying potentially failed components in the device assembly is a software controlled automated process. In one embodiment of the present invention, a component-level block diagram is coupled to the controllable devices in the device assembly so that an operator can set up and conduct the functional testing of the device assembly. The diagram is also updated with the generated test data for displaying to the user potentially failed components and other information for helping the user to diagnose and to troubleshoot the situation.

Claims

1. A method for performing testing of an electronic device comprising:

(a) commanding the execution of prescribed functional tests of components contained in the device;

(b) collecting testing data generated by functional tests; and

(c) responding to the generated testing data for identifying potentially faulty components;

wherein the method is by a software program operating automatically when started by an operator.

2. The method of claim 1 further comprising:

forming a graphical block diagram of the electronic device; and

displaying the potentially faulty components in the graphical block diagram.

3. The method of claim 2 further including:

showing each of the potentially faulty components in an outline block having a transparent area for displaying the potentially faulty component.

4. The method of claim 3 including:

displaying the outline block with a peripheral border having a color.

5. The method of claim 4 further including:

flashing the border on and off.

6. The method of claim 4 further including:

calculating failure cause percentages for the potentially faulty components wherein the percentages have specific values and the color is one of a group of colors; and

associating the specific values with a respective color from the group.

7. The method of claim 1 further comprising:

displaying information arising from the component and the test data.

8. The method of claim 1 wherein the electronic device includes latches having connection points, the method further comprising:

selecting connection points for providing test paths to test a prescribed combination of potentially faulty components; and

commanding the execution of a functional test of the prescribed combination for determining if any of the potentially faulty components are no longer identified as potentially faulty.

9. The method of claim 8 wherein the electronic device includes controllable elements, the method further comprising:

forming a graphical block diagram representing the electronic device;

coupling the block diagram to the electronic device; and

using the block diagram for controlling the controllable elements.

10. The method of claim 1 wherein the electronic device includes controllable elements, the method further comprising:

forming a graphical block diagram representing the electronic device;

coupling the block diagram to the electronic device; and

using the block diagram for controlling the controllable elements.

11. The method of claim 1 further comprising:

locating the electronic device in a remote location;

operating the software program over a network coupled to the electronic device.

12. The method of claim 1 further comprising:

pausing the method at the time when the testing of the components has failed a functional test.

13. The method of claim 1 further comprising:

executing the prescribed functional tests in a hierarchy ranging from simple to complex.

14. The method of claim 13 further comprising:

conducting a test and eliminate process by executing functional tests for identifying those components that are conclusively acceptable; and

excluding conclusively acceptable components from being identifiable as potentially faulty components.

15. The method of claim 13 wherein the electronic device includes controllable elements, the method further comprising:

forming a graphical block diagram representing the electronic device;

coupling the block diagram to the electronic device; and

using the block diagram for controlling the controllable elements.

16. The method of claim 14 wherein the electronic device includes latches having connection points, the method further comprising:

selecting connection points for providing test paths to test a prescribed combination of potentially faulty components; and

commanding the execution of a functional test of the prescribed combination for determining if any of the potentially faulty components are no longer identified as potentially faulty.

17. The method of claim 1 wherein the electronic device includes latches having connection points, the method further comprising:

selecting connection points for providing an alternative test path to the test paths used for conducting prior functional tests;

executing a functional test using the alternative test path.

18. The method of claim 1 further comprising:

conducting a test and eliminate process by executing functional tests for identifying those components that are conclusively acceptable; and

excluding conclusively acceptable components from being identifiable as potentially faulty components.

19. An apparatus for performing diagnostic testing of an electronic device wherein the device includes a plurality of components and a plurality of test paths linking groups of the components via selectable latches, the device further including at least one testing program operable for conducting prescribed functional tests of the groups via the test paths;

the testing program operable for generating testing data;

the selectable latches being selected as required for enabling the testing program to conduct the prescribed functional tests of the groups, the apparatus comprising;

an inventory model for identifying the components that are tested by and the latches used by the prescribed functional tests;

a graphical component-level block diagram of the device for displaying the selectable latches, the components of the groups and the corresponding test paths used when the functional tests are being conducted;

a component-level diagnostic agent for responding to the testing data and for identifying which of the components are potentially faulty as a result of failing at least one of the functional tests; and

a test executive being coupled to the device, the testing program, the inventory model, the component-level block diagram and the diagnostic agent;

the test executive being so constructed and arranged that when an operator selects a test start command, the test executive starts the prescribed functional tests of the groups and the diagnostic agent operates for receiving testing data;

wherein the block diagram is updated so that any components identified as being potentially faulty are displayed as potentially faulty in the block diagram.

20. The apparatus of claim 19 wherein the block diagram is coupled to the device assembly and being operable so that when the operator selects one of the selectable latches in the block diagram, the test executive selects a corresponding selectable latch in the device.

21. A method for troubleshooting an electronic device wherein the device includes controllable elements, the method comprising:

executing prescribed tests of groups of the elements for identifying potentially faulty elements;

collecting testing data generated by the tests;

forming a block diagram of the device;

coupling the block diagram to the controllable elements for communications to and from the controllable elements;

displaying the controllable elements in the block diagram; and

responding to the generated testing data for displaying generated testing data.

22. The method of claim 21 wherein the controllable elements include components and latches, the method further comprising:

using the block diagram for setting up a prescribed combination of components and latches for forming signal paths connecting the combination.

23. The method of claim 22 further comprising:

transmitting prescribed signals through the signal paths;

generating operating data resulting from the signals; and

displaying in the block diagram the operating data as it is being generated.