SEQUENTIAL CHEMICAL VAPOR DEPOSITION
First Claim
1. An apparatus for growing a thin film comprising:
- a reaction chamber configured to contain at least one substrate;
a first reactant vapor source in selective communication with the reaction chamber;
a second reactant vapor source in selective communication with the reaction chamber;
an excess vapor removal system in communication with the reaction chamber;
a device configured to cause at least a portion of the reactant vapors within the reaction chamber to form vapor fragments selectively in time; and
a controller configured to introduce vapor reactants from the first reactant vapor source and second reactant vapor source to the reaction chamber in alternate and sequential pulses to deposit a desired film by atomic layer deposition on a substrate when the substrate is present in the reaction chamber.
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Abstract
The present invention provides for sequential chemical vapor deposition by employing a reactor operated at low pressure, a pump to remove excess reactants, and a line to introduce gas into the reactor through a valve. A first reactant forms a monolayer on the part to be coated, while the second reactant passes through a radical generator which partially decomposes or activates the second reactant into a gaseous radical before it impinges on the monolayer. This second reactant does not necessarily form a monolayer but is available to react with the monolayer. A pump removes the excess second reactant and reaction products completing the process cycle. The process cycle can be repeated to grow the desired thickness of film.
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Citations
50 Claims
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1. An apparatus for growing a thin film comprising:
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a reaction chamber configured to contain at least one substrate;
a first reactant vapor source in selective communication with the reaction chamber;
a second reactant vapor source in selective communication with the reaction chamber;
an excess vapor removal system in communication with the reaction chamber;
a device configured to cause at least a portion of the reactant vapors within the reaction chamber to form vapor fragments selectively in time; and
a controller configured to introduce vapor reactants from the first reactant vapor source and second reactant vapor source to the reaction chamber in alternate and sequential pulses to deposit a desired film by atomic layer deposition on a substrate when the substrate is present in the reaction chamber. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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28. An apparatus for growing a thin film comprising:
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a reaction chamber configured to contain at least one target substrate;
a first reactant vapor source connected to the reaction chamber;
a second reactant vapor source connected to the reaction chamber;
an excess vapor removal system connected to the reaction chamber;
a device configured to cause at least a portion of the reactant vapors outside the reaction chamber to form vapor fragments selectively in time; and
a controller configured to alternately and sequentially introduce pulses of reactant vapor from the first reactant vapor source and second reactant vapor source to the reaction chamber, such that a desired film is deposited by atomic layer deposition on the target substrate when the target substrate is present in the reaction chamber;
wherein the first reactant vapor source is a metal precursor. - View Dependent Claims (29, 30, 31, 32, 33, 34, 35, 36, 37, 38)
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39. An apparatus for growing a thin film comprising:
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a reaction chamber comprising a wafer holder;
a first reactant vapor source connected to the reaction chamber;
a remote vapor fragment generator connected to the reaction chamber;
a second reactant vapor source connected to the reaction chamber through the remote vapor fragment generator;
an excess vapor removal system connected to the reaction chamber; and
a controller configured to cause pulses of reactant vapor from the first reactant vapor source and second reactant vapor source to be introduced alternately and sequentially to the reaction chamber to deposit a desired film by atomic layer deposition on a wafer supported by the wafer holder;
wherein the first reactant vapor source and the excess vapor removal system define a vapor flow path through the reaction chamber substantially parallel to a major surface of the wafer holder. - View Dependent Claims (40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50)
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Specification